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This Sources Sought opportunity was posted on August 25, 2008. The submission period has ended. Browse the details below for market research, or find similar active opportunities.

EDXRF Spectrometer and components

Closed
FDA-SOL-1048847Federal

Contract Overview

Solicitation details, issuing organization, response deadlines, documents, and interested companies for this government contract opportunity.

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FA8601 Aflcmc Pzio

POSTED

1 day ago

DEADLINE

in 2 days

General Info

Agency

N/A

NAICS

334516 - Analytical Laboratory Instrument Manufacturing

Place of Performance

Food & Drug Administration 1431 Harbor Bay, Alamedo, CA, 94502, USA

Set-Aside

SBA

Documents

0

No documents available

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Timeline

PhaseClosed
Posted

Sources Sought

Response Deadline

Deadline has passed

Submission Closed

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Organization & Contact Information

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AgencyN/A
Contacts2 people available
OfficeN/A
Organization / Agency
N/A
Office AddressN/A
Contacts
Karen L ConroyContract Specialist
Sandra K. DavisContract Specialist

Full Description

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Description(s): 1. THIS IS A SOURCES SOUGHT NOTICE to determine the availability and capability of small businesses (including certified 8(a), Small Disadvantaged, and HUBZone firms; veteran and service-disabled veteran-owned small businesses, and women-owned small businesses. This notice is for planning purposes only, and does not constitute an Invitation for Bids, a Request for Proposals, Solicitation, Request for Quotes, or an indication the Government will contract for the items contained herein. This notice is not to be construed as a commitment on the part of the Government to award a contract, nor does the Government intend to pay for any information submitted as a result of this notice. The Government does not reimburse respondents for any cost associated with submission of the information being requested or reimburse expenses incurred to interested parties for responses to this sources sought. Any responses received will not be used as a proposal. The U.S. Food and Drug Administration (FDA) is seeking to identify any sources with capabilities or prior experience that can provide a ARL QUANT'X EDXRF Spectrometer in accordance with the following statement of work including installation of workstation and on-site application training. EDXRF Technical Specifications Important specifications are highlighted in italics. General Description - The spectrometer shall be based on Energy-Dispersive X-ray Fluorescence (EDXRF). - The spectrometer shall be capable of performing quantitative elemental analysis of Na - U. - The spectrometer shall be capable of analyzing samples in solid, powder, and liquid states. - The spectrometer shall be capable of analyzing samples of any shape and size up to the dimensions of the sample chamber. - The spectrometer shall be designed for bench-top operation and, when installed with all accessories connected, shall have a compact footprint not to exceed 90 cm x 90 cm. Performance - The spectrometer shall achieve minimum detection limits (3-sigma) of < 3 ppm for Iron (Fe) and <4 ppm for Lead (Pb), when measured using Conostan Standard S-21, 100 ppm. - The spectrometer shall show counting stability of better than 0.3% RSD (relative standard deviation) during an 8-hour testing period under typical analytical conditions in a controlled laboratory environment. Site Requirements - The spectrometer shall operate from a standard electrical outlet and accept power from 110-240 VAC. - The spectrometer shall not use cooling water or require any external connections or utilities, such as gas or water, other than electrical power. X-ray Excitation - The spectrometer shall be equipped with an X-ray tube and Rh target for optimal excitation of all energy lines from Na-U. - The X-ray tube shall be air-cooled, with no external liquid cooling or pump systems allowed. - The X-ray tube shall use an end-window design with a thin 76-micron Be window for maximum flux and optimal low-keV excitation. - The X-ray tube and high-voltage generator shall produce at least 50W of power and operate over a voltage range of 4 to 50 kV, adjustable in steps 1 kV or less, and a filament current range of 0.02-1.98 mA, adjustable in steps 0.02 mA or less. - The X-ray tube shall be powered only during sample analysis and automatically turn-off after analysis completion. - The spectrometer shall not employ any shutter mechanism. - All voltage and current settings shall be selectable by user and fully software-controlled. - The X-ray generation system shall be fully protected against voltage, current and power overloads with fuse protection. - The spectrometer shall be equipped with an interlock system to protect the operator from accidental exposure to X-rays in case of electrical or mechanical malfunction. X-ray Filters and Collimators - The spectrometer shall employ primary X-ray beam filters for optimal excitation intensity, sample throughput and control over background scatter. - The spectrometer shall allow for at least seven (7) primary X-ray beam filters for selective control over peak-to-background across the periodic table. - The X-ray beam filters shall be selectable by user and fully software-controlled. - The spectrometer shall have available user-selectable collimators or apertures down to 1 mm to reduce X-ray spot size for analysis of small features or samples. X-ray Detection - The X-ray detector shall be capable of detecting elements from Sodium (Na) to Uranium (U). - The spectrometer shall use a Li-drifted Silicon Si(Li) X-ray Detector with energy resolution <155 eV as measured at 5.9 keV (Mn). - The X-ray detector shall not use Liquid Nitrogen (LN-free). - The X-ray detector shall have an active crystal area of at least 15 mm2 for highest sensitivity to low intensities. - The X-ray detector shall have an ion pump for the purpose of maintaining cryostat vacuum under He purge conditions. Signal Processing - The spectrometer shall employ Digital Pulse Processing that features: o Software-adjustable peak-shaping times (2-40 ?s) for optimal analytical flexibility o Processing of up to 100,000 counts per second (live) for optimal throughput. o X-ray processing and spectral range from 400 eV to 40960 eV. Sample Chamber - The sample chamber shall operate in air, vacuum or helium environments. The chamber environment must be software-controlled and user-selectable. For vacuum operation, an external vacuum pump shall be supplied by vendor. - The spectrometer shall include a sample stage or holder that accepts samples of any shape or size, up to chamber dimensions. - The spectrometer shall include a sample spinner to rotate the sample during analysis. - The spectrometer shall include an automated sample changer with capacity for at least 10 samples up to 47 mm in diameter or 20 samples up to 32 mm in diameter. - The spectrometer shall be equipped with a sample chamber that accommodates samples up to 30 cm x 30 cm x 5 cm Sample IMAGING - The spectrometer shall be equipped with an on-board High-Resolution Digital Camera. Facilitates identification, positioning and analysis of small samples or features - Spatial resolution of < 0.5 mm meets all practical needs - CCD Sensor with 510 x 492 pixels for VGA quality images - All-digital design, USB connectivity and dedicated light source - Operates in air, vacuum or helium atmospheres Computer Data System - The spectrometer shall be connected to the personal computer without the use of interface or pc boards. An ethernet connection would be preferred. - The spectrometer shall be capable of interfacing with any modern personal computer, including laptop pc's, even when not supplied by the vendor. - Desktop PC 1. The spectrometer shall be controlled by an external desktop personal computer (PC) with the following minimum configuration: o 3.0 GHz processor, 512 Mb RAM, 40 Gb hard drive o 19 LCD flat-panel display o Microsoft Windows XP Operating System o DVD/CDRW drive Operating Software General: - The operating software shall control all spectrometer operations, including X-ray source output, filter selection, sample positioning, chamber atmosphere, and data processing. - The operating software shall be capable of analyzing the entire elemental range via automated collection of multiple spectra at different excitation conditions. - The operating software shall automatically adjust the X-ray source output to achieve optimal count rate regardless of variations in sample shape, size or composition. - The operating software shall run under the Microsoft Windows XP operating system and support multiple simultaneous windows in a multi-tasking environment. - The operating software shall include hardware diagnostics with a pass-fail determination of spectrometer performance. - The operating software shall include a standardless analysis package for EDXRF to account for a variety in X-ray excitation and peak overlaps. Special Software Requirements: - The operating software shall correct for all possible overlap and background effects as well as sample-specific physical properties, such as sample area, height, and mass, any of which can affect the results. - The operating software shall scan each sample using 8 excitation conditions; obtain a complete elemental profile of the sample across multiple emission series to determine the presence or the absence of target elements without any prior knowledge of the material. - The operating software shall be delivered, pre-calibrated. The major features must include: 1. . Thorough analysis for all possible elements between Sodium and Uranium 2. . Fully pre-calibrated on the spectrometer and ready to analyze out of the box 3. . Iterative compositional analysis and spectrum deconvolution reduce false positives 4. . Clear, intuitive reporting of major, minor and trace components 5. . Correction for beam size and physical sample properties - Methods must be adjustable for specific applications. User Interface - The operating software shall support customizable desktop operating environments. - The operating software shall include password-protection for critical files to prevent inadvertent or intentional changes to analytical methods and operating parameters. - The operating software shall be capable of full analytical operation and data processing on a stand-alone computer workstation without connection to the spectrometer hardware. - The operating software shall output to a monitor, printer, network location, and any storage medium, such CDRW drive or hard drive. - The operating software shall produce analysis reports in a format compatible with MS Word and Excel applications. Spectrum Processing - The operating software shall include a spectrum display, which will feature at minimum: o Spectrum overlapping of up to 10 spectra o Automatic spectral peak identification o Manual peak identification and labeling o Vertical and horizontal scaling o Print, copy and paste operation into MS Word, Excel, Powerpoint or graphics program. - The operating software shall provide digital background filter removal, gross and net peak intensities, and least-squares empirical peak overlap deconvolution. Calibration - The operating software shall support multiple calibration techniques, including linear, quadratic, peak ratios, empirical and theoretical matrix correction (FP) algorithms. - The operating software shall have no limits or restrictions on the number of elements analyzed at one time. - The operating software shall have no limits or restrictions on the maximum number, composition or type of standards used for calibration of the spectrometer, regardless of the type of calibration technique selected. - The operating software shall display graphical calibration curves for fit evaluation. - The operating software shall allow exclusion or inclusion of any standard or any of its components from the calibration. - The operating software shall store collected spectral data for all standards and unknown samples and allow the analyst to reprocess or review any analysis at any time. Fundamental Parameters - The operating software shall include Fundamental Parameters (FP) algorithms that support standardless, semi-standardless and standard-based calibrations. - The operating software shall include Fundamental Parameters (FP) algorithms for complete multi-element composition and thickness analysis of thin deposits or layered structures, such as sputtered films or filter media. - The Fundamental Parameters algorithm shall be capable of calibration with any combination of pure elements, primary certified standards, secondary standards, and thickness or filter standards. - The Fundamental Parameters algorithm shall allow theoretical calibration and analysis of elements without given standard values by reference to elements with given values. - The Fundamental Parameters algorithm shall include the following factors in the analysis of unknown samples: o Component stoichiometry as specified by the analyst o Unmeasured components, such as oxygen, carbon and others o Added compounds, such as binders or grinding agents o Known concentrations for selected components such as those obtained by other analytical techniques o Sample mass loading when analyzing thin deposits or filtered particulate matter Specialized Software Modules: Standardless Analysis with required functions of: - algorithms to correct for all possible spectral overlap - algorithms to correct for background effects - correction factors that are sample-specific for physical properties, such as sample area, height, and mass - Thorough analysis for all possible elements between Sodium and Uranium - Fully pre-calibrated on the spectrometer and ready to analyze out of the box - Iterative compositional analysis and spectrum deconvolution reduce false positives - Clear, intuitive reporting of major, minor and trace components - Correction for beam size and physical sample properties - Methods can be adjusted for specific applications FP Thickness Analysis: - Measures thickness, mass and composition of up to 6 layers containing any number of elements - Corrects for thickness and matrix effects, including inter- and intra-layer absorption, secondary fluorescence, and substrate fluorescence - Calibrations can be performed using single- or multi-element bulk materials, thickness standards, or application-specific type standards - Allows analysis of standardless elements by reference to elements with standard values - Analyzes stoichiometric compounds, including but not limited to oxides, nitrides and hydrides - Allows entry of given or known thickness or composition values for any layer or element - Accounts of unmeasured (organic) components when total sample mass is specified - Intuitive, flexible graphical user interface for definition of layer structure - Analytical range from angstroms to microns and from ng/cm2 to g/cm2. Reference Standards required with instrument: - Aluminum (Al) metal sample for peak profiling and calibration. - Phosphorus (NH4H2PO4) pressed powder sample for peak profiling and calibration. - Sulfur (S) pressed powder sample for peak profiling and calibration. - Titanium (Ti) metal sample for peak profiling and calibration. - Chromium (Cr) metal sample for peak profiling and calibration. - Manganese (MnO) pressed powder sample for peak profiling and calibration. - Iron (Fe) metal sample for peak profiling and calibration. - Cobalt (Co) metal sample for peak profiling and calibration. - Nickel (Ni) metal sample for peak profiling and calibration. - Zinc (Zn) metal sample for peak profiling and calibration. - Selenium (As2O3) pressed powder sample for peak profiling and calibration. - Bromine (KBr) pressed powder sample for peak profiling and calibration. - Molybdenum (Mo) metal sample for peak profiling and calibration. - Tin (Sn) metal sample for peak profiling and calibration. - Barium (BaSO4) pressed powder sample for peak profiling and calibration. - Tungsten (W) metal sample for peak profiling and calibration. - Mercury (HgS) pressed powder sample for peak profiling and calibration. - Lead (Pb) metal sample for peak profiling and calibration. Warranty and Service - Vendor services shall include spectrometer installation and performance verification of the spectrometer and accessories at customer's site. - Vendor services shall include two (2) days of on-site training covering general operation and maintenance of the spectrometer. One admission to a vendor-sponsored training class shall be included (excluding travel expenses). - The spectrometer shall be installed by factory-certified technicians. - All equipment, including hardware and software, shall be warranted against defective materials, workmanship and failures under normal use for a period of two years (24 months) after acceptance, per vendor's standard terms and conditions. Companies are encouraged to respond if they have the capability and capacity to provide the identified services with little or no disruption of services to the current users at the FDA. Interested small business potential offerors are encouraged to respond to this notice. However, be advised that generic capability statements are not sufficient for effective evaluation of respondents' capacity and capability to perform the specific work as required. Responses must directly demonstrate the company's capability, experience, and/or ability to marshal resources to effectively and efficiently perform each of the tasks described above at a sufficient level of detail to allow definitive numerical evaluation; and evidence that the contractor can satisfy the minimum requirements listed above wile in compliance with FAR 52.219-14 ("Limitations on Subcontracting"). Failure to definitively address each of these factors will result in a finding that respondent lacks capability to perform the work. Responses to this notice shall be limited to 15 pages, and must include: 1. Company name, mailing address, e-mail address, telephone and fax numbers, website address (if available), and the name, telephone number, and e-mail address of a point of contact having the authority and knowledge to clarify responses with Government representatives. 2. Name, title, telephone number, and e-mail addresses of individuals who can verify the demonstrated capabilities identified in the responses. 3. Business size for NAICS 334516 with size limitation standards of $6.5M and status, if qualified as an 8(a) firm (must be certified by the Small Business Administration (SBA), Small Disadvantaged Business (must be certified by SBA), Woman-Owned Small Business, HUBZone firm (must be certified by SBA), and/or Service-Disabled Veteran Owned Small Business (must be listed in the VetBiz Vendor Information Pages). 4. DUNS number, CAGE Code, Tax Identification Number (TIN), and company structure (Corporation, LLC, partnership, joint venture, etc). Companies also must be registered in the Central Contractor Registration (CCR) at www.ccr.gov to be considered as potential sources. 5. Identification of the firm's GSA Schedule contract(s) by Schedule number and contract number and SINs that are applicable to this potential requirement are also requested. 6. If the company has a Government approved accounting system, please identify the agency that approved the system. Please submit copies of any documentation, such as letters or certificates to indicate the firm's status (see item #3 above). To the maximum extent possible, please submit non-proprietary information. Any proprietary information submitted should be identified as such and will be properly protected from disclosure. Interested offerors should submit their capability statement not exceeding fifteen (15) pages in length, excluding standard brochures. SUBMISSIONS ARE DUE no later than 4:00pm, Eastern Time, September 5, 2008. The capabilities response shall be e-mailed to: Karen.conroy@fda.hhs.gov. All information received in response to this notice that is marked Proprietary will be handled accordingly. Responses to the notice will not be returned, nor there any ensuing discussions or debriefings of any responses. Information provided in response to this notice will be used to assess alternatives available for determining how to proceed in the acquisition process. This notice is part of Government Market Research, a continuous process for obtaining the latest information on the commercial status of the industry with respect to their current and near-term abilities. The information provided herein is subject to change and in no way binds the Government to solicit for or award a competitive contract. The FDA will use the information submitted in response to this notice at its discretion and will not provide comments to any submission; however, the content of any responses to this notice may be reflected in subsequent solicitation. FDA reserves the right to contact any respondent to this notice for the sole purpose of enhancing FDA's understanding of the notice submission. This announcement is Government market research, and may result in revisions in both its requirements and its acquisition strategy based on industry responses. It is emphasized that this is a notice for planning and information purposes only and is not be construed as a commitment by the government to enter into a contractual agreement, nor will the government pay for information solicited.

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