Micro x-ray source for defect detection in metallic AM structures

NASA LaRC is seeking a micro x-ray source specifically designed for defect detection in metallic additive manufacturing (AM) structures, as detailed in their Statement of Work (SOW). This procurement is being conducted as a Total Small Business Set-Aside under solicitation number 80NSSC26922252Q, with responses due by January 20, 2026. The requirement falls under NAICS code 334519 and is managed by the NASA Shared Services Center located at Stennis Space Center, MS, with the place of performance in Hampton, Virginia. Interested parties are instructed to reference the solicitation ID in all correspondence and may contact Lindsey McLellan for more information. Although the provided document summaries include specifications for an unrelated RF amplifier required by NASA Glenn Research Center, the primary focus of this contract is the micro x-ray source for inspecting metallic AM structures for defects. The project underscores NASA’s emphasis on advanced non-destructive testing technologies to improve quality assurance in manufacturing processes. The solicitation encourages participation from small businesses capable of meeting these technical and delivery requirements.