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Quality Assurance & Testing Services

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Federal

Contract Overview

Solicitation details, issuing organization, response deadlines, documents, and interested companies for this government contract opportunity.

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The contract entails independent testing and inspection of semiconductor devices to ensure full compliance with Defense Logistics Agency quality standards, specifically applying an AQL 1.0 threshold for major defects and AQL 4.0 for minor defects. All testing activities must be documented with complete traceability to support auditable records and verification of conformance throughout the supply chain. The services are provided under a subcontract arrangement as part of the Department of Defense’s broader quality assurance framework, with the work governed by the NAICS code 541380 for other scientific and technical consulting services. Performance is expected to meet stringent military specifications without reliance on the contractor’s internal quality systems alone, requiring third-party verification and reporting to DLA requirements. The contract was posted on July 16, 2026, and is managed through the DIBBS system under contract number SPE7M526P4202.

General Info

Independent testing of semiconductor devices to meet DLA quality standards with AQL 1.0 and 4.0 thresholds, fully documented and traceable.

Agency

Department Of Defense → Defense Logistics AgencyView Agency

NAICS

541380 - Testing Laboratories and ServicesView NAICS

Place of Performance

Not specified

Set-Aside

NONE

Documents

This scope was carved out of SPE7M5-26-T-154T.

The full solicitation package (1 document), including the RFP, is on the prime solicitation, not on this scope.

View the prime solicitation

SEMICONDUCTOR DEVIC

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Timeline

Posted

subcontract

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Organization & Contact Information

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AgencyDepartment Of Defense → Defense Logistics Agency
ContactsNo contacts available
OfficeN/A
Organization / Agency
Department Of Defense → Defense Logistics Agency
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Office AddressN/A
ContactsNo contact information available

Full Description

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Independent testing and inspection of semiconductor devices to meet DLA quality standards including AQL 1.0 (major) and AQL 4.0 (minor) with traceable documentation.

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