REQUEST FOR INFORMATION (RFI)/SOURCES SOUGHT - ATOMIC FORCE MICROSCOPY

N0016419SNB63 - REQUEST FOR INFORMATION (RFI)/SOURCES SOUGHT - ATOMIC FORCE MICROSCOPY - FSC 6640 - NAICS 334516 Issue Date: 08 March 2019 - Closing Date: 22 March 2019 - 12:00 PM EDT REQUEST FOR INFORMATION (RFI) /SOURCES SOUGHT: The Government is issuing this RFI as part of a market research to determine the availability of sources to provide a fully operational Atomic Force Microscopy (AFM) system, to meet the below specifications, at the Naval Surface Warfare Center (NSWC) Crane, IN. The Government intends to award a sole source contract to Oxford Instruments Asylum Research, Inc., 6310 Hollister Ave, Santa Barbara, CA 93117-3115. This effort will be conducted on a sole source basis in accordance with the statutory authority 10 U.S.C. 2304(c)(1) as implemented by FAR 6.302-1. The basis for restricting competition is Oxford Instruments Asylum Research, Inc., is the only responsible source capable of satisfying the agency's requirements and no other type of supplies will satisfy agency requirements. Award to any other source would result in duplicative cost to the Government that is not expected to be recovered through competition as well as unacceptable delays in fulfilling the agency requirement. The purpose of this requirement is to procure an Atomic Force Microscopy (AFM) at NSWC Crane. The AFM shall include the following scanning modes, performance metrics, and accessories: Imaging and Point Measurement Modes The AFM requires the following imaging (scanning) modes: - Contact Mode - Intermittent Contact Modes o Noncontact o Tapping o Control of tip landing forces during intermittent contact - Scanning Microwave Impedance Microscopy Module (PrimeNano) for Nanoscale Mapping of Permittivity and Conductivity o Must be able to profile dopant concentration o Capacitance detection noise floor: 0.5 aF o Minimal detectable dopant concentration: 1014 atoms/cm3 - Current mapping and current spectroscopy (C-AFM) o Current gain range: 105 to 1010 V/A - Scanning Spreading Resistance Microscopy (SSRM) - Scanning Capacitance Microscopy (SCM) o Minimal detectable dopant concentration range: 1015 - 1020 carriers/cm3 - Electrostatic Force Microscopy (EFM) - Kelvin Force Microscopy (KFM) - Time Dependent Dielectric Breakdown Spectroscopy o Bias voltage range: ? 200 volts dc - Scanning Thermal Microscopy (SThM) o Local Joule heating of sample o Local mapping of sample's thermal conductivity - Magnetic Force Microscopy - Photoconductive AFM o Optical access that allows for independent illumination at visual and IR wavelengths - Nanomechanical Analysis Tools (Mapping and Point Measurements) o Elastic modulus o Storage modulus o Loss modulus o Loss tangent o Deformation o Energy dissipation o Adhesion Sample Size and Instrument Configuration The AFM requires the following configurations: - Maximum sample size: 80 mm (or greater) - Maximum sample thickness: 27 mm (or greater) - XY Scanner range: 90 - m (or greater) o XY Scanner noise: < 150 pm - Z scanner range: 15 - m (or greater) o Z Scanner noise: < 35 pm - Scanners need to have closed loop control - System needs to be on a vibration isolation table and have acoustic and electromagnetic shielding - System requires a configurable control system that can be used to control homebuilt instrumentation - System requires a scripting software interface that allows for the development of custom measurement and scanning sequences, as well as automation of: o Acquisition signals o XY and Z scanners o Voltage bias signal Accessories The AFM requires the following accessories: - Photovoltaic Illumination o Accessories that allow the sample to be illuminated during AFM scanning - Liquid Cells o Cells that allows for low-noise AFM imaging in liquid environments - Accessory for the application of a variable magnetic field to the sample, both in-plane and out-of-plane - The system requires physical access to the sample that allows for the inclusion of 3rd party micromanipulators without interfering with the AFM's XYZ scanning o Require the use of these manipulators to place bias voltages on the sample - Breakout boxes that allow for access to control and acquisition signals In accordance with Department of Defense FAR Supplement (DFARS) Procedures, Guidance, and Information (PGI) 206.302-1, the Government is accepting information from companies potentially capable of meeting the requirements as described above. Responses should include availability, budgetary cost estimate, and lead time of the solution, as well as, whether a demonstration unit can be provided to expedite the decision making process. All interested parties are encouraged to submit company and product literature, a white paper no longer than two pages in length, and/or other pertinent information, such as a description with performance parameters and a statement of current availability, summary of prior testing, test reports, a budgetary estimate of test articles, production units, production quantity breaks, mitigate the reason why the Government should not procure this effort on a sole source basis as stated above, and /or identify other Government contracts with similar efforts for the Government(s) consideration. Responses to the Market Survey shall include the following: Submitter's Name Street Address, City, State, Zip Code Business Size Point of Contact (POC) POC Telephone Announcement Number: N00164-19-R-GM71 Contractors must be properly registered in the Government System for Award Management database (SAM). Contractors may obtain information on SAM registration and annual confirmation of requirements by calling 1-866-606-8220, or via the internet at www.sam.gov. At the current time, NO FUNDING IS AVAILABLE for contractual efforts. This RFI/sources sought does not constitute an Invitation for Bids (IFB), a Request for Quote (RFQ), or a Request for Proposal (RFP) and it should not be construed as a commitment of any kind by the government to issue a formal solicitation or ultimately award a contract. The US Government is in no way liable to pay for or reimburse any companies or entities that respond to this announcement. Any costs incurred by interested companies in response to this announcement will NOT be reimbursed. Market Survey information may be submitted to the Point of Contact any time prior to the expiration of this announcement. The Point of Contact for this effort is Ms. Kori Jacobsen at kori.jacobsen@navy.mil. The subject line of the email should include the RFI number (N0016419SNB63) and the respondent's name. The mailing address is: COMMANDER; ATTN MS. KORI JACOBSEN BLDG 3373; NAVSURFWARCENDIV; 300 HIGHWAY 361; CRANE, IN 47522-5001. If any part of the submittal is classified, please contact the POC for appropriate submission information. All information marked as proprietary information will be safeguarded to prevent disclosures to non-government personnel and entities. Your interest in the response is appreciated.