AFM Controller

AFM CONTROLLER. The solicitation number is FE230012720076. The NAICS Code is 334516. The size standard is 500 employees. The government intends to solicit and negotiate with one source under the authority of FAR 13.106-1(b)(1) and FAR 6.302-1(a)(2)(iii). The proposed source is Bruker-Nano Inc., 112 Robin Hill Road, Santa Barbara, CA. This requirement is for AFM Controller with Multimode 8 head, Peak Force TUNA and SCM modules for our Nanoscope Multimode IIIa Atomic Force Microscope (AFM). The updated AFM system must be fully Multimode 8 compatible, including the scanner head. Includes two days installation and training for the new systems. The AFM Controller is an essential part of the AFM, which provides measurement capabilities required for funded research and student education at the Air Force Institute of Technology. This equipment is capable of characterizing a variety of surface topography, electrical, thermal and mechanical properties of aerospace materials at nanometer scales. Specifications are as follows: MULTIMODE8 UPGRADE Configured as follows: CONFIGURED SYSTEM: MULTIMODE8-U-NSV - MULTIMODE8-U UPG PKG INCL NSV V8-compatible Upgrade to an Existing MultiMode SPM without an Existing NanoScope V Control Station -- For a MultiMode SPM without an existing NanoScope V Control Station, this upgrade provides a new V8-compatible NanoScope V Control Station, MultiMode base electronics upgrade, 37 pin adapter (Model 37PA) and a 30-inch LCD monitor. -- Recommended MultiMode upgrades include Model MMLNQU for Q-control capability or a new head, Model TVOH-MULTIMODE, for both Q control and application module capability -- Enables operation of our exclusive ScanAsyst Mode using exclusive Peak Force Tapping technology, including automatic image optimization technology -- REQUIRES return of certain existing AFM hardware following NanoScope V installation. Items to be returned include the NanoScope controller and Digital Signal Processor (DSP or DSI) board from the existing Control Station controller (Models E, II, III, IIIa, IV or IVa) plus the Extender Electronics Module (Models PHASE-01, PHASE-R, QUADREX) if AFM system is equipped with PHASE. Contact Customer Service for RMA number for return paperwork. If controller is not returned within 30 days following upgrade installation, the customer will be invoiced the full price of the NanoScope V Control Station. -- REQUIRES Model UNIVECPOT for Electrochemistry (NOT compatible with the older Electrochemistry AFM/STM Converter Base for the MultiMode SPM, Model MMECAFM) -- REQUIRES cable clamp Model VT-103-CC-UNIV if upgrading the NanoScope Control Station for a MultiMode SPM currently housed in an older VT-103-MM-X Integrated Acoustic/Vibration Isolation hood -- REQUIRES a minimum of one-day installation/training (Model ITCS1-SRV) that must be purchased separately -- NOTE: 1) NOT compatible with obsolete MultiMode predecessor AFM/LFM models MONITORS: MONITOR - FACTORY SUPPLIED MONITOR MM8-PFTUNA PeakForce TUNA Application Module for MultiMode8 -- High bandwidth, high gain, low noise module with user selectable gain settings that enables exclusive PeakForce TUNA mode -- Also enables TUNA, TR-TUNA, and CAFM PeakForce TUNA Mode -- Measures ultra-low currents between probe tip and sample as probe is scanned over the sample. -- Operates in PeakForce Tapping mode with direct force control and minimal lateral forces. Thus avoids the artifacts stemming from probe and sample damage and retains highest spatial resolution. This enables use on soft, fragile, or loosely bound samples that are likely to be damaged by contact mode. Measures both, peak current and cycle averaged current. -- Includes Bruker's proprietary ScanAsyst automated scan optimization. -- Includes Bruker's proprietary PeakForce QNM for directly correlated nanomechanical information. PeakForce QNM allows quantitative mapping of nano-mechanical properties including elastic modulus, adhesion, deformation, and dissipation, while simultaneously imaging sample topography at high resolution. Includes 6 gain settings ranging from 100nA/V to 20pA/V. Achieves >10kHz bandwidth for peak current detection at highest amplifier gain setting, which at the same time provides sub-100fA noise level in the cycle averaged current under imaging conditions. -- A bias of mV to 10V can be applied. TUNA Mode -- Measures ultra-low currents between the probe tip and a sample (typically covered with a thin dielectric film) as the probe is scanned over the sample -- Images variations in quality/integrity of thin dielectric films by measuring the tunneling current, including variations in film thickness, location of electrical defects, and other characteristics -- Current is measured using an ultra-low current amplifier with 3 gain settings ranging from 1nA/V to 20pA/V. Provides typical noise level below 100fA at highest gain under imaging bandwidth. -- A bias of mV to 10V can be applied TR TUNA Mode -- TR TUNA uses torsional resonance feedback. This reduces both vertical and lateral forces on samples, which enables TR TUNA to be used on soft samples otherwise likely to be damaged by contact mode (e.g. polymers) or on loosely bound samples likely to be disrupted by contact mode (e.g. nanowires). -- Current is measured using an ultra-low current amplifier 3 gain settings ranging from 1nA/V to 20pA/V. Provides typical noise level below 100fA at highest gain under imaging bandwidth. CAFM Mode -- Measures low-level currents between the probe tip and a sample as the probe is scanned over the sample -- Images variations in conductivity and quality/integrity of conductive samples by measuring the current. CAFM is used for measuring variations in film thickness, location of electrical defects, and other characteristics. -- Current is measured using a low current amplifier with 3 gain settings ranging from 100nA/V to 2nA/V. -- A bias of mV to 10V can be applied Additional Information -- Package includes Application Module, software and cantilever holder and one 10-pack of PFTUNA probes -- Includes one additional day on-site installation/training when purchased with any other on-site installation/training package (Models ITCS, ITCS1-SRV or ITCS3) -- If purchased separately, customer must also purchase one day of installation/application training (Model ITCS1-SRV) -- CE compliant -- REQUIRES a MultiMode8 SPM with application module ready optical head. -- NOTE: An acoustic/vibration isolation system is strongly recommended Top-view Optical Head for Existing MultiMode SPMs -- Standard or Application Module Top-view Optical Head for on-axis viewing of probe and sample (select type when ordering) -- Included with the MultiMode SPMs but available as a replacement part -- Provides upgraded head electronics for lowest possible noise and cleanest possible images when imaging in Q control with a Quadrex-enhanced NanoScope Control Station -- Includes one Electric Field Cantilever Holder (Model MMEFCH) with Application Module Optical Head -- REQUIRES Application Module-ready electronics and PHASE or QUADREX-enhanced Control Station for Application Module Optical Head -- REQUIRES serial number of existing MultiMode SPM on Bruker price quotation and on customer PO -- NOTE: Application Module Optical Head is NOT compatible with obsolete MMAH Series Atmospheric Hoods for the MultiMode, but is compatible with new MMAH2 Series Configured as follows: HEAD: MM-AM - MULTIMODE SPM AM HEAD 125 x 125-micron Vertical Engage Leak Resistant AFM Scanner -- 125-micron x 125-micron scan size; 5.0-micron vertical range -- Includes single-tube piezoelectric tube scanner with three-point support for microscope head -- Includes calibration rulings -- Scan sizes listed are nominal maxima for piezo drives of - 220V (standard on all NanoScope models) -- Designed for vertical motion, eliminating tilt and lateral movement of the cantilever during engage. Fully motorized and requires no manual adjustments -- Offers increased resistance against damage caused by fluid -- Includes a 4-year warranty covering damage caused by fluid during normal use Video-only Microscope System -- Compatible with all current MultiMode 8 and MultiMode-NS3D configurations -- Allows optical imaging simultaneous with MultiMode operation -- 10X Nikon objective (WD = 49.5mm; NA = 0.2; and resolution of 1.6-micron) -- Erect image (the optical image is not inverted horizontally or vertically) -- 12.7mm travel two-axis stage positions the MultiMode under the microscope -- Maximum field of view approximately 400x500 microns. Digital zoom levels at 2X, 4X, and 8X. -- High performance 5MP digital camera with USB interface -- All cables and other accessories included -- Fiber coupled illuminator (CE compliant, auto-switching for worldwide power voltages) -- NOTE: Video image is displayed within the NanoScope software for MultiMode 8 systems and in a standalone software application for systems with NanoScope 3D controllers. -- NOTE: Optional 5X objective (NIKON5X) is required for compatibility with MultiMode environmental hoods (MMAH2-series accessories). -- NOTE: Consult factory for compatibility with obsolete MultiMode systems. Due to USB camera interface, requires a computer with Windows XP. Sample Kit for PeakForce QNM -- Includes one each of PDMS-SOFT-1, PDMS-SOFT-2, PSFILM, HOPG-15M, FSILICA, SAPPHIRE-15M, RS-15M, and PS-LDPE samples -- NOTE: While formulated for stability, the supplied samples may change with aging Cantilever Holder for Scanning in Fluid (TappingMode, Force Modulation) with the MultiMode SPM -- Glass cantilever holder for fluid operation for contact mode, TappingMode, and Force Modulation. The cantilever is acoustically driven by a separate piezo oscillator for larger amplitude modulation. -- Includes 10 Oxide-Sharpened Silicon Nitride NanoProbes (SNL-10) recommended for soft samples -- NOTES: 1) Updated design now securely holds new silicon nitride probes from Bruker Nano Probes that have thinner substrate chips; 2) This replaces the contact-only fluid cell, Model FC. This notice of intent is not a request for competitive quotations; however, any quotation received within five (5) days of the issuance of this notice will be considered by the government. A determination by the government not to compete this proposed contract based upon responses to this notice is solely within the discretion of the government. Information received will normally be considered solely for the purpose of determining whether to conduct a competitive procurement. Any quotations should be e-mailed to robert.neeb@wpafb.af.mil no later than 1:00 p.m., Eastern Standard Time, 21 Nov 2011. Only proposals received by this date will be considered. Any questions should be directed to Robert Neeb at 937-522-4547.