High-Frequency Manual Probe Station Supply

The contract calls for the supply of a 200 mm manual probe station equipped with both DC and RF micropositioners designed to support high-frequency measurements up to 110 GHz, ensuring compatibility with advanced semiconductor testing environments. The equipment must be fully integrated and operational upon delivery, meeting stringent performance standards required for precision characterization of semiconductor devices in research and development settings. The probe station is intended for use within a federal laboratory context, with performance specifically targeted at the Gaithersburg location, where it will be deployed for critical material and component analysis. This is a small business set-aside subcontract under NAICS code 333318, exclusively reserved for small businesses as defined by the SBA. The solicitation was posted on August 7 2026, with a firm deadline for responses on August 20 2026. The contracting entity is the National Institute of Standards and Technology under the U.S. Department of Commerce, and the procurement is structured to support domestic small business participation in advanced metrology and semiconductor testing infrastructure. No point of contact is listed publicly, and all inquiries must be handled through the official SAM.gov portal linked in the solicitation.