MICROSCOPE

This is a combined synopsis/solicitation for commercial items prepared in accordance with the format in FAR Subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation; proposals are being requested and a written solicitation will not be issued. This requirement is set-aside 100% for small-business only. The NAICS Code for this synopsis/solicitation is 333314, Optical Instruments and Lens Manufacturing, Size Standard 500 employees. Solicitation/Purchase Request Number F2KBAD2145A006 is issued as a Request for Quote (RFQ). This document incorporates provisions and clauses that are in effect through Federal Acquisition Circular 2005-60, Effective 26 July 2012. CLIN 0001 1 Each Microscope (See Specs Below) FOB: Destination Inspection and Acceptance: Destination FAR 52.204-7, Central Contractor Registration; FAR 52.212-1, Instructions to Offerors-Commercial Items; FAR 52-212-3, Offeror Representations and Certification-Commercial Items (all offerors shall include a completed copy of this provision with their proposal); FAR 52.212-4, Contract Terms and Conditions-Commercial Items; FAR 52.212-5 Contract Terms and Conditions Required to Implement Statutes or Executive Orders-Commercial Items. [in paragraphs (b) and (c) the following clauses apply 52.219-6 Alt II, 52.219-14, 52.225-1, 52.222-3; 52.222-19; 52.222-21, 52.222-26, 52.222-37; 52.222-39, 52.222-50, 52.223-18 52.225-13, 52.232-33]; FAR 52.219-1 Alt I, Small Business Program Representations; FAR 52.233-3, Protest After Award, FAR 52.242-13, Bankruptcy; FAR 52.252-1, Solicitation provisions incorporated by reference; FAR 52.252-2, Clauses and provisions may be accessed in full text at http://farsite.hill.af.mil/ DFAR 252.204-7004 ALT A, Central Contractor Registration; DFAR 252.209-7001, Disclosure of Ownership or Control by the Government or a Terrorist Country; DFAR 252.211-7003, Item Identification and Valuation; DFAR 252.212-7000, Offeror Representations and Certifications--Commercial Items; DFAR 252.212-7001, Contract Terms and Conditions Required to Implement Statutes or Executive Orders Applicable to Defense Acquisitions of Commercial Items [in paragraph(s) (a) and (b) the following clause(s) apply 52.203-3, 252.225-7001, 252.225-7002, 252.225-7012, 252.225-7021 Alt I, 252.232-7003, 252.243-7002, and 252.247-7023]. DFAR 252.225-7000, Buy American Act - Balance of Payments Program Certificate; DFAR +1 (555) 000-0000, Representation of Extent of Transportation by Sea, DFAR 252.232-7010, Levies on Contract Payments All payments are to be paid via the Internet through the Wide Area Work Flow (WAWF) system. WAWF may be accessed at https://wawf.eb.mil. WAWF training may be accessed online at http://www.wawftraining.com. Payment information may be accessed using the DFAS website at https:www.dfas.mil. Your purchase order/contract number or invoice will be required to inquire status of your payment. Quotes may be E-mailed (preferred) to contact@example.gov or mailed to AFNWC/PKOA, ATTN: Bernadette N. Kerkhoff, 2000 Wyoming Blvd SE, Bldg. 20604, Room B-18, Kirtland AFB., NM 87117, or faxed to +1 (555) 000-0000 ATTN: Bernadette N. Kerkhoff. ADDITIONAL INFORMATION: Be advised that all interested parties must be registered in the Systems for Award Management (SAM) Database in order to receive an award. If you are not registered you may request an application at +1 (555) 000-0000 or through the SAM website at http://www.sam.gov. SPECIFICATONS High Level Message - AFM Modularity o AFM scanner, controller, control and image processing software is the same across all AFM platforms o Cost effective upgradeability and eliminates the need to learn different software platforms for different AFM systems - Tip Scanning AFM scanner o Eliminates potential damage to Piezoelectric (PZT) scanner when imaging in liquids - True Environmental Control o Only the tip and sample are exposed to the controlled environment o PZT scanner, laser, detector and electronics are protected from the sample environment - Single Pass Electric Measurements such as Kelvin Force Microscopy (KFM) o Faster, higher spatial resolution and less susceptible to drift than "interleave" methods Technical Specifications & Capabilities - Contact Mode AFM - AAC Mode AFM (oscillating cantilever mode) - Lateral Force Microscopy (LFM) - Phase Imaging - Force Measurements - Single Pass Kelvin Force Microscopy (a.k.a. Surface Potential Microscopy) o Single Pass measurements are faster, higher spatial resolution and less susceptible to drift than "interleave" methods - Electric Field Microscopy (EFM) - Liquid Imaging o System should include a fluid cell. Fluid cells must fit on interchangeable sample plates for heating, cooling or Acoustic AC modes. ? Fluid cell should be constructed of Kel-F (or similar) and be available in Teflon. ? Fluid cell should be held with quick clamping mechanism for fast assembly. ? Fluid cells should be priced economically (< $220 US) so that they can be conveniently replaced or spares provided to prevent cross-contamination of experiments or allow multiple users to prepare for experiments simultaneously - True Environmental Control o Must support an environmental chamber to be integrated with the microscope head for fast sample loading, have a gasket seal for complete isolation of gases in the chamber from the scanner and have a minimum of four ports for gas and/or electrical connectors. The chamber must be constructed of optically transparent and solvent/acid/base resistant material to allow viewing of the sample during operation. The chamber should be air-tight at moderate positive and negative pressures (as opposed to a "purge chamber" requiring a continuous flow of gasses). The system must be compatible and tolerant of a condensing environment as well. All scanner and detector electronic components should be sealed from the sample environment. - All imaging should be done with a top down scanner (sample always stationary and tip/cantilever scanning) for sample size flexibility. This type of design also removes the danger of scanner damage from fluids. - The system must have provisions for hermetically sealed scanner assemblies, with o-ring seals. Motorized vertical approach with the option of individual control of each motor for sample tilt compensation should be standard. Automatic, motorized engagement should be standard. - Scanners must have interchangeable cantilever holders that are hermetically sealed from the environment and provide for the following modes of operation: Contact AFM, Oscillating probe/AC-AFM, EFM, LFM, etc. The system quoted should include such cantilever holders for AFM, AC-AFM, and KFM/EFM operation in air, fluid, or controlled environments. The system quoted should include a scanner with at least 9um x 9um range. Scanners and cantilever holders must allow a Z axis, 90 degree optical view for tip placement and laser alignment in air or under fluid. - Sample environment must allow combinations of environmental conditions, such as electrochemistry, heating/cooling, and controlled gas/solvent environment without damage to the system. - System must include full computer control and software package running under Windows XP. Computer should connect to system via USB or similar in order for computer to be user replaceable or laptop driven, if so desired, in order to keep computer upgrade costs low.