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Radiation Hardening of Non-Hardened Commercial Microelectronics

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MDA26BZ04-NV002SBIR / STTR

Contract Overview

Solicitation details, issuing organization, response deadlines, documents, and interested companies for this government contract opportunity.

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The Missile Defense Agency is seeking innovative solutions to enhance the radiation tolerance of commercially available microelectronics without relying on traditional radiation-hardening methods or access to advanced foundry processes. The focus is on leveraging advanced packaging techniques and chiplet architectures to integrate high-performance, non-hardened commercial components—fabricated using state-of-the-art processes like sub-16nm FinFETs or Gate All Around technologies—with radiation-hardened monitoring or compensation elements. The goal is to achieve a minimum Single Event Latch-up immunity of 75 LET and Total Ionizing Dose survival of 300 kRad(Si) by embedding a radhard watchdog chiplet or using heterogeneous packaging to monitor and correct radiation-induced errors in real time, preserving the performance, size, weight, and power advantages of commercial parts. Solutions must begin with already-fabricated bare die or packaged components and exclude shielding or any modification requiring access to foundry masks or process changes. This effort targets small businesses under the SBA Total Small Business Set-Aside, with a response deadline of July 22, 2026. The solicitation emphasizes practical, scalable approaches that avoid costly and time-consuming radiation-hardened design cycles while meeting stringent space system survivability standards. By combining non-hardened high-speed components with intelligent, radiation-resilient packaging-level countermeasures, the program aims to bridge the performance gap between commercial electronics and DoD space system requirements, enabling faster deployment of advanced capabilities in hostile radiation environments without compromising reliability or mission success.

General Info

Enhance commercial microelectronics radiation tolerance via packaging and chiplets, no foundry changes, target 75 LET and 300 kRad.

Agency

Department of Defense → Missile Defense AgencyView Agency

NAICS

334413 - Semiconductor and Related Device Manufacturing View NAICS

Place of Performance

Not specified

Set-Aside

SBA

Documents

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No documents available

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Timeline

PhaseSolicitation
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Organization & Contact Information

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AgencyDepartment of Defense → Missile Defense Agency
ContactsNo contacts available
OfficeUS
Organization / Agency
Department of Defense → Missile Defense Agency
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Office AddressUS
ContactsNo contact information available

Full Description

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The performance and survivability of Department of War (DoW) and space systems, especially those operating in space environments, are critically affected by radiation. Radiation testing of parts is a major cost and schedule driver for DoW and space systems. The market for microelectronics that meet government radiation requirements is small. Commercial microelectronics could meet the government’s performance requirements while failing to meet its natural space requirements. Some state-of-the-art processes like Gate All Around (GAA) technologies meet the DoW’s performance and Size, Weight, and Power (SWAP) requirements yet might not meet all of the DoW’s survivability requirements. MDA seeks a process which utilizes advanced packaging techniques and chiplets to pair fast ‘non-hardened’ components with slower hardened packages together, thereby increasing the radhard (radiation hardened) tolerance while maintaining the high performance of non-hardened commercial technologies. The goal is to target a minimum Single Event Latch-up (SEL) immunity of 75 Linear Energy Transfer (LET) and Total Ionizing Dose (TID) survival of 300 kRad(Si). This topic will seek to take existing Commercial Off-The-Shelf (COTS) parts/chiplets fabricated using state-of-the-art processes such as sub-16nm FinFETs (Fin Field Effect Transistor) or GAA modify them or provide a package on package like solution such that their radiation tolerance meets natural space requirements. This includes solutions based on heterogeneous packaging, where a radhard "watchdog" chiplet is integrated to monitor and compensate for radiation-induced errors in the high-performance COTS component. At a minimum, the final product should meet an SEL immunity requirement of at least 75 LET and must be able to survive at least a 300 kRad TID. Solutions relying on shielding the part or requiring access at the state-of-the-art foundry to add or change masks are not of interest. All solutions should start with already fabricated parts either in bare die form or packaged parts.

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