66 -- Transition Electron Microscope with STEM imaging

This is a combined synopsis/solicitation for commercial items prepared in accordance with the format in the Federal Acquisition Regulation (FAR), Subpart 12.6, as supplemented with additional information included in this notice. This ammended announcement constitutes the only solicitation. Proposals are being requested. A written solicitation will not be issued. Solicitation N00421-05-R-VS06 is issued as a Request for Proposal (RFP). If two or more capable small businesses are responsive to this synopsis/solicitation it will be set-aside for small business. The North American Industry Classification Systems (NAICS) code is 334519. The small business size standard is 500 employees. The incorporated document provisions and clauses are those currently in effect through the Federal Acquisition Regulation and Defense Acquisition Regulation Supplement. The Naval Air Warfare Center, Aircraft Division, Patuxent River, MD plans on making an award for delivery and installation of one basic functional fully integrated 200KV Transition Electron Microscope (TEM) with integrated Scanning TEM (STEM) for materials microanalysis, all hardware and software compatible sub-supplier components, training for two operators, one year maintenance service, and necessary manuals. The Government has a limited amount of Capital Purchase Program funding to acquire this system and will evaluate the proposed system against a ceiling value of $571,000.00 and the desired specifications listed below. All items shall be of new manufacture. CLINS will be proposed on a Firm Fixed Price basis. Consideration will be made for offer of trade in value and removal of the existing system and associated equipment. Items with desired features are as follows:CLIN 0001. Transmission Electron Microscope (TEM)-The TEM shall be a state-of-the-art 200KV Accelerating Voltage equipped with a Lab6 source and capable of observing samples over a wide range of discrete accelerating voltages. The TEM shall be capable of, if so equipped, accommodating analytical techniques: BrightField/Annular DarkField imaging, EDS intensity line profiling and mapping, EDS/ EELS data cube acquisition, Biological/Soft Material Applications, Cryomicroscopy, Tomography. Specific performance requirements at time of purchase are: A. Resolution: 0.23nm (+/-35), B. STEM - 0.5nm resolution (with high resolution polepiece), C. Dark Field (DF)/High Angle Annular Dark Field (HAADF) for STEM detected by a single detector, D. Accelerating Voltage: 200KV maximum accelerating voltage with semi-continuous HV control, 50eV/step minimum Electron Gun Assembly: Lab6 Filament, E. Auto filament heating through an ON/OFF switch, F. Magnification: X 2,000 ~ 1,500,000, G. Low Mag Mode: X 50 ~ 6,000, H. PC Control of all microscope operating conditions and specimen stage. Control Software, Server Computer, 18" flat panel display, and trackball, I. Complete microscope operating conditions, specimen stage and a fully integrated STEM, Digital Image Acquisition, and EDS analytical system, J. EDS solid angle of 0.28 steradians with appropriate polepiece and EDS detector, K. Alpha selector that instantly switches between beam size and convergent angle, L. Specimen Anti-contamination device: baking by heater and selection of Sputter Ion Pump (SIP) vacuum system linked to baking, M. Differential Vacuum System utilizing Sputter Ion and Diffusion Pumps, Microprocessor Controlled, featuring "radial evacuation" of the specimen area, N. Eucentric Motorized 5 axis Side Entry Goniometer shall be provided, Specimen rods to be configured with a double - O Ring configuration that is differently pumped following specimen insertion. Piezoelectric controlled specimen stage. Analytical Pole Piece: 0.23nm ,+/-35 tilt x and y; 0.12 steradian solid angle; 25 take-off angle, O. Image viewing chamber that simultaneously accommodates a wide angle TV-Camera and STEM detector, P. Motorized Objective Aperture, Q. Specimen Holder - Double Tilt, R. High Resolution Dark Field Imaging (5), S. Zoom Focus and Stigmation, T. Electromagnetic TEM Image Shifting, U. Independent Lens "Free Run" Control Optimum under focus with variable focus steps Auto through focus, V. Minimum Dose System for beam sensitive imaging, W. Beam Stopper, X. Automatic Sheet Film Camera (3" X 4") including (2) each light-tight loading and receiving boxes and 200 cassettes High Contrast Aperture - Lower position objective aperture Automatic Exposure System allowing variability of either brightness or time electron current and spot metering) Complete Data Recording on negatives, including kV, magnification, film number, scale, operator code and label Video Printer to record microscope operating conditions Digital Hour Meter for instrument time and filament time Column baking system (with timer), Y. Fully Automatic Vacuum System (10-8torr) with Penning Gauge, Z. Air Compressor, AA. Sheet Film Desiccator, BB. Haskris Water Recirculator or equivalent Water Recirculator, CC. Operator's Chair, DD. Installation and proof of resolution guaranteed in customer's Laboratory, EE. Two years warranty on all parts and labor, FF. Four-day user's course customer's facility, including tuition and supplies for two operators, GG. One set of operator's manuals. CLIN 0002 - STEM Observation Device with Image Acquisition- DELL-P4-GX270 or equivalent system. DELL OPTIPLEX GX270 PENTIUM 4 Computer & Monitor or equivalent system. CLIN 0003 -GAT-894.20P.2 2K X 2K Pixel Ultrascan 1000 CCD for 200Kev operation with installation & training OR Equivalent System. CLIN 0004 - BF/DF STEM DETECTOR GAT or equivalent DETECTOR CLIN 0005- STEM Interface Electronics CLIN 0006 - LK-IETEM100 or equivalent system -INCA ENERGY TEM 100 EDS for TEM System with Installation & Training or equivalent. System Computer: VL420 profile: mini tower. Chipset: Intel 845. Processor: Intel P4. Speed: 1.8 GHz. RAM: 512MB (SDRAM PC133), expandable to 1.5GB (in 3 slots). Other Drives: 1 X 3.5 Floppy, 1 X PC ZIP, 1 X CDROM; 1 X CDRW (internal). HP c16d Series. Graphics: NVIDIA GeForce 2MX (32GB) Network: (Integrated Intel Pro/100VE. Network connection LAN interface (1 X RJ-45 Ethernet port). Slots: 3 X PCI slots 1X AGP, used for graphics card. System Computers of different manufactures can be used provided they meet above requirements. Microsoft Office. Internet Explorer. Microanalytical processor. Software features (compatible to INCA platform). Printer. CLIN 0007 - IBM-LCD18 or equivalent system - IBM T-860 18" LCD Flat Panel Monitor W/Keyboard & Mouse or equivalent system. Resolution: 1600 x 1200. CLIN 0008 - LK-L818 or equivalent system - INCA System Table or equivalent system table CLIN 0009 - Spectrum Imaging Base Package CLIN 0010 - Installation & Spectrum Imaging Training for Two operators. CLIN 0011- GAT-788 or equivalent system - Digiscan II SEM/STEM Image Acquisition CLIN 0012- Installation and Operator Training- Two operators shall receive training. CLIN 0013- GAT-707.10 or equivalent system - EDS ACQUISITION CLIN 0014- GAT-707.20 or equivalent system - EDS ANALYSIS MODULE CLIN 0015- JUS-KMSHARE or equivalent - Keyboard and Mouse Sharing for PC CLIN 0016. Inland Transportation, Inside Delivery and Support: The vendor shall deliver and install the new 200KV STEM to Naval Air System's Materials Laboratory, Building # 2188, Room # 112A at Patuxent River MD. Warranty on the described system is 12 months from the date of installation and first use by the customer. This includes all parts and labor, up to two preventative maintenance visits during that year, and unlimited emergency calls. CLIN 0017- Trade-in Value of JEOL CMX- 100CX- The vendor shall remove and provide a Trade-in Value for the current JEOL CMX-100CX located in Room # 112A, Building # 2188, Materials Laboratory, Naval Air Systems Command, Patuxent River, MD and install new 200 KV STEM at the above location. In addition, offored for trade in value is 1 JEOL DSG Imaging system (purchased 1 year ago), to include scanning control system, Optiplax GX 1 Computer, ADi Microscan Monitor, and HP Laserjet 2100TN Printer. CLINS 0001 - 0017 shall be delivered within 180 days after contract award to Naval Air Systems Command, NAWCAD Aerospace Materials Division, AIR 4.9.7, Building 2188, 48066 Shaw Road, Patuxent River, MD 20670. Mark for Rabindra Mahapatra +1 (555) 000-0000. Inspection and acceptance shall be made at destination upon delivery. The Following FAR/DFAR provisions and clauses apply to this acquisition: 52.212-1, 52.212-3, 52.212-4, 52.212-5, 52.219-8, 252.212-7001. The following clause also applies: DFARS 252.204-7004, - Required Central Contractor Registration (CCR). Registration in CCR is mandatory. The provision at FAR 52.212-2 Evaluation - Commercial Items will apply to this solicitation. The following evaluation factors will be used to evaluate offers: Technical, Price and Past Performance in a Best Value Continuum. Each Offeror shall include a completed copy of the provision at FAR 52.212-3, OFFEROR REPRESENTATIONS AND CONTRACT TERMS AND CONDITIONS - COMMERCIAL ITEMS (OCT 1995) that is incorporated by reference and applies to this acquisition. The provision FAR 52.212-5 Contract Terms and Conditions Required to Implement Statutes or Executive Orders-Commercial Items applies to this acquisition. All items should be covered by one-year warranty in accordance with commercial practices and the availability of a service contract upon expiration of warranty. Although this purchase does not include the requirement, the vendor shall guarantee the availability of a maintenance contract for five (5) years after first year use by the customer. Used or Refurbished equipment will not be accepted. All offers are due by 1600 on 2 June 2005. Offers should be mailed to: ATTN: Miriam-Ellen Bonk, Naval Air Systems Command, 21983 Bundy Road, Bldg 441 Unit 7, Room 105, Patuxent River, MD 20670-1127. Questions can be directed to Miriam-Ellen Bonk at +1 (555) 000-0000, (Fax +1 (555) 000-0000), or contact@example.gov.