APXPS spectrometer with differential pumping system and detector
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The Department of Commerce, through the Office of the Director, is seeking an APXPS spectrometer equipped with a differential pumping system and detector to be located in Gaithersburg, Maryland. This procurement supports the development of a new plasma-XPS metrology platform designed for quantitative, sub-monolayer sensitive in-situ chemical analysis of wafer surfaces, thin films, and interfaces during plasma processing. By leveraging expertise in plasma-surface interaction and operando photoelectron spectromicroscopy, the project aims to enhance semiconductor process development and inspection toolsets for next-node technology. The initiative involves collaboration between NIST, industrial partners, and academic institutions to advance the fundamental measurement science of plasma-surface interactions.
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GAITHERSBURG, MDSet-Aside
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