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APXPS spectrometer with differential pumping system and detector

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Federal

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The Department of Commerce, through the Office of the Director, is seeking an APXPS spectrometer equipped with a differential pumping system and detector to be located in Gaithersburg, Maryland. This procurement supports the development of a new plasma-XPS metrology platform designed for quantitative, sub-monolayer sensitive in-situ chemical analysis of wafer surfaces, thin films, and interfaces during plasma processing. By leveraging expertise in plasma-surface interaction and operando photoelectron spectromicroscopy, the project aims to enhance semiconductor process development and inspection toolsets for next-node technology. The initiative involves collaboration between NIST, industrial partners, and academic institutions to advance the fundamental measurement science of plasma-surface interactions.

General Info

Commerce seeks an APXPS spectrometer for plasma-XPS metrology development in Gaithersburg, Maryland.

NAICS

334413 - Semiconductor and Related Device Manufacturing

Place of Performance

GAITHERSBURG, MD

Set-Aside

NONE

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Organization & Contact Information

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AgencyDepartment Of Commerce → Office of the Director
Contacts1 person available
OfficeN/A
Office AddressN/A
Contacts
NATHALI MEDINA

Full Description

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Advanced in situ and operando methods for real time monitoring of the chemical status of wafer surfaces, thin films, and interfaces during plasma processing are essential for semiconductor process development and control. We will build upon NIST's leading expertise in plasma-surface interaction, plasma diagnostics, and operando photoelectron spectromicroscopy to develop a new plasma-XPS metrology platform for quantitative sub-monolayer sensitive in-situ chemical analysis of wafer surfaces during plasma processing. This innovative metrology will be a valuable addition to the next node semiconductor process development and inspection toolset and, in a broader scope, to the fundamental measurement science of plasma-surface interaction. We will collaborate with industrial partners (see letters of support) and academia in the development, implementation, and dissemination of plasma-XPS metrology. The data generated during this project and th

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