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Assembled circuit boards

Active
Federal

Contract Overview

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This forecast from the Department of Commerce Office of the Director focuses on the procurement of assembled circuit boards to support the development of wide bandgap power devices. These devices are critical for all-electric applications in the automotive and aerospace sectors, where extreme reliability standards are required to ensure minimal failure rates over long operational lifespans. The project addresses the current industry challenge of relying on expedient testing methods that lack a direct correlation to long-term reliability, which often leads to inefficient guard-banding and redundancy. By improving reliability modeling and data confidence, the initiative aims to reduce the time and cost associated with statistically significant lifetime acceleration physics. The work is slated for performance in Gaithersburg, Maryland, under NAICS code 334413.

General Info

Commerce Department procuring assembled circuit boards for wide bandgap power device reliability development.

NAICS

334413 - Semiconductor and Related Device Manufacturing

Place of Performance

GAITHERSBURG, MD

Set-Aside

NONE

Documents

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Organization & Contact Information

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AgencyDepartment Of Commerce → Office of the Director
Contacts1 person available
OfficeN/A
Office AddressN/A
Contacts
NATHALI CLARK

Full Description

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Wide bandgap power devices are key to an all-electric future. Most of the applications in this all-electric future (automotive, aerospace, etc.) have extreme reliability requirements, such as less than 1 ppm failure in 25 years. Ensuring such extreme reliability requires careful modeling and use of aggressive guard-banding (de-rating parts) and redundancy to overcome risks due to incomplete or low-confidence reliability data. Fundamentally, there is a remarkable time cost associated with performing statistically significant long-term reliability tests with appropriate lifetime acceleration physics. This time cost is so steep that industry has turned to more expedient tests to test larger numbers of devices. The direct correlation between these rapid tests and long-term reliability is generally missing. As a result, designers of high reliability systems are left with an incomplete picture which further perpetuates the perceived need for

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