Automated Cassette-to-Cassette Photoluminescence (PL) and White-Light Reflectance Wafer (WLR) Mapping System

The National Research Council Canada (NRC) is seeking to procure an Automated Cassette-to-Cassette Photoluminescence and White-Light Reflectance Wafer Mapping System intended to enhance the material characterization process by providing highly uniform two-dimensional measurements. This system must complement the existing G10 MOCVD Reactor, which efficiently produces semiconductor wafers at a high throughput, necessitating an analytical tool that can match this volume to avoid workflow delays. The required system should offer fast, automated wafer handling and accurate measurement capabilities to seamlessly integrate with the production pace, ensuring optimal efficiency in both research and manufacturing settings. The solicitation for this contract was posted on January 5, 2026, with a response deadline of January 20, 2026. It is managed by the National Research Council of Canada, a federal agency, with Kacendra Dion serving as the contracting authority. The project location is within Canada, reflecting the government’s ongoing commitment to advancing semiconductor research infrastructure. Interested vendors can obtain further information or submit their proposals through the official CanadaBuys portal.