This Combined Synopsis/Solicitation opportunity from Department Of Commerce was posted on February 24, 2026. The submission period has ended. Browse the details below for market research, or find similar active opportunities.
CHIPS High-Throughput High-Resolution X-ray Laminography/Tomography System for Advanced Packaged Semiconductor Devices and Substrates
Contract Overview
Solicitation details, issuing organization, response deadlines, documents, and interested companies for this government contract opportunity.
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The contract seeks proposals for the acquisition of a high-throughput, high-resolution X-ray laminography and tomography system tailored for advanced packaged semiconductor devices and substrates. This system is intended to enhance the Department of Commerce’s National Institute of Standards and Technology (NIST) capabilities in semiconductor device inspection and analysis. The solicitation, designated under number 1333ND26QNB030031, emphasizes cutting-edge technology to support the evolving needs of semiconductor metrology and research. The solicitation was posted on February 12, 2026, with a response deadline of February 26, 2026. It falls under the NAICS code 334413, which covers semiconductor manufacturing equipment. The contracting office is located in Gaithersburg, Maryland, and the primary point of contact for this opportunity is Tracy Retterer, with a secondary contact, Donald Collie, also available for inquiries. This combined synopsis solicitation includes detailed statements of work and applicable provisions and clauses to guide potential offerors in preparing their responses.
General Info
Place of Performance
Gaithersburg, MD, 20899, USASet-Aside
Timeline
Submission Closed
Organization & Contact Information
Full Description
Amendment 0001:
Amendment changes include the following:
- The required response date is extended from February 26, 2026 to March 9, 2026
- No Statement of work change
- Questions and Answers:
Question1: Is there a cleanroom specification?
NIST Response: No. The instrument will be installed in a general purpose lab in the advanced measurement laboratory facility, but not within a cleanroom.
Question 2: Are you flexible on the footprint (size/dimension)
NIST Response: NIST expects the analytical instrument (source, stages, detectors, and shielded enclosure) to fit within the footprint specified by 10.2. Additional space is available in the lab around the instrument for service access, and for support equipment (including chase space for air compressor/dryer if required, and a work area in the lab for control and analysis PCs).
Question 3: Are the devices in JEDEC Trays?
NIST Response: Typically no. NIST requires significant flexibility to load samples that are within the size envelope described by specification 5. Samples will include full wafers, coupons (partial wafers), individual or groups of packaged devices, as well as atypical sample geometries. To meet requirement 5.1, vendors must include 5 sample carriers that are compatible with the automated loading system. Carriers supporting a JEDEC tray is only one possible way to meet that requirement.
See Combined Synopsis Solicitation_1333ND26QNB030031, Attachment 1 - Statement of Work, and Attachment 2 - Applicable Provisions and Clauses attachments for solicitation details.
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