Cross Section Polisher

PLEASE READ THIS NOTICE CAREFULLY AS IT CONSTITUTES THE ONLY NOTICE THAT WILL BE PUBLISHED. The Federal Bureau of Investigation (FBI) intends to negotiate a one-time sole source contract with JEOL USA Inc., 11 Dearborn Road, P.O. Box 6043, Peabody, MA 01961. The Government intends to negotiate with only one source under the authority of FAR 6.302-1 for a Cross Section Polisher to support TEDAC's explosives characterization research efforts. TEDAC currently does not have any specialized equipment to properly cross section and polish a specimen for SEM analysis. This notice will be distributed solely through the General Services Administration's Federal Business Opportunities (FBO) Website (www.fedbizopps.gov). Interested parties are responsible for monitoring the FBO site to ensure they have the most up-to-date information about this acquisition. The North American Classification System Code is 334516, Analytical Laboratory Instrument Manufacturing; the size standard is 500 employees. Explosives characterization research and testing efforts have generated an impressive array of critical technical data since 2004. This research has involved the performance of small-scale safety testing, thermal stability characterization, and explosive performance characterization, such as diameter effect/critical diameter testing of various improvised explosives. The previous research has been performed at various contractor locations. Future research will be performed at the TEDAC Improvised Explosives Detection and Synthesis (TIEDS) Center in Huntsville, AL. This ongoing endeavor consists of comprehensive and detailed studies of the hazards of different explosives, the feasibility of their manufacture by terrorist organizations, and their explosive performance and damage potential when utilized in improvised explosive devices (IEDs). Element 2 of the IAA, titled Homemade Explosives (HME) Synthesis and Characterization, specifically identifies "safety and characterization testing" as a task to be performed and documented as part of the explosives characterization research effort. A crucial part of such testing is to identify the damage potential of the explosive. This is often done by the use of witness materials placed near the detonating explosive to record it damage effects. The damage effects are then thoroughly assessed using a scanning electron microscope (SEM) to understand their characteristics. Before being assessed for these characteristics the specimens must be properly prepared for SEM analysis, which involves cross sectioning and polishing the specimen to specific standards. The requested accessory shall provide a highly sensitive method to cross section and polish specimens that are routinely applied worldwide for forensic casework and materials research. TEDAC has recently purchased a JEOL JSM-IT300LV SEM to analyze various improvised explosives to assist in determining the effect of crystal structure on the safety hazards of the material and to analyze explosive damage imparted to witness materials. The following equipment JEOL USA, Inc is required: 1. Cross Section Polisher (PN: IB-19500(CP), Qty: 1 each 2. Specimen Rotation Holder for CP PN: IB-09520SRH), Qty: 1 each 3. Shield Plate/Masking Plate (PN: MC09400/2), Qty: 1 each The requirements for this technical analysis capability are listed below. 1. Instrument consisting of an evacuated chamber, ion gun, shield retainer, and specimen staging system that supports two-dimensional movement and angle control. The instrument shall project an ion beam vertically onto the shield plate and the sample surface, creating a cross section along the boundary of the area being etched by the beam and the area blocked by the shield plate. 2. The instrument shall come with a CCD camera allowing for precise positioning of the region to be etched. The camera shall be equipped with a touch-screen and features such as cross-hairs with graduated reticule that permits proper sample positioning and beam alignment. 3. Operation of the instrument shall be fully controlled via the touch-screen interface, allowing the user to control instrument operating conditions such as, but not limited to, gas flow, milling time and camera views. 4. The instrument shall have a quick-start function, allowing the user to start pecimen milling at an appropriate chamber vacuum within six (6) minutes. 5. The instrument shall be equipped with a user-programmable timer for unattended operation. 6. The instrument shall have an auto-start function that can be programmed via the touch-screen interface. 7. The instrument shall come with a consumable shield plate. The mask holder shall have (X, Y, Z) positioning capability. 8. The gas flow shall be controlled by a completely integrated mass-flow controller and include a function that automatically measures and creates a plot of the current as a function of the gas flow and sets the correct operating conditions for a particular kV setting. The settings shall be able to be stored and recalled as separate recipes for up to five (5) different conditions. 9. The vacuum system of the instrument shall consist of roughing pump, internal turbo pump, and a vacuum gauge. The vacuum system shall be able to change to a safe condition where the roughing pump introduces air to prevent oil back flow in case of a power failure. 10. The instrument's ion gun voltage must be adjustable from 0 - 8 kV, with continuous steps of 0.5 kV. The beam size shall be no less than 500 microns (FWHM) at 6. The ion source shall produce an ion beam current of up to 280 micro-amps. The instrument shall be equipped with two (2) separate ion beam current detectors, one (1) located above and one (1) below the specimen stage. The user shall be able to make appropriate adjustments via the touch-screen interface. 11. The specimen stage shall come with micrometers to allow accurate positioning of the specimen within at least +/- 10 microns of the region of interest. The specimen stage shall be capable of adjustment in (X, Y) direction with a tolerance of +/- 3 mm) as well as adjustment of the sample rotation in X-Y plane with a tolerance of +/- 5. The specimen stage shall be equipped with a magnetic locking mechanism for locking the specimen holder to the masking plate. The specimen stage shall be capable of tilting +/- 30 during the operation of the instrument. 12. The instrument shall have a fine milling function allowing the user to reduce the final milling accelerating voltage for improved specimen surface quality for EBSD analysis. 13. The instrument shall also have an intermittent milling function that can be used for the proper preparation of heat-sensitive and volatile specimens with minimal damage imparted to the sample. 14. The instrument's etching rate shall be at least 500 microns/hour (the average value over two (2) hours at an 8 kV voltage for a specimen of Si, 100 microns from the sample edge). 15. The user shall have the ability to prepare large areas of a specimen by Ar ion beam polishing, as well as final polishing of already existing metallurgical mounts. The instrument shall come equipped with an optional rotation holder capable of continuous rotation of 360 during operation and angle adjustment with respect to the beam (0-5). The holder shall be easily interchangeable with the regular holder. Based on market research conducted and contacts made with knowledgeable individuals within the government and related industry, it has been determined the FBI's requirement can only be provided by JEOL USA, Inc. as they are the sole-manufacturer and distributer of the Cross Section Polisher described above and is the only vendor that can provide the instrument that meets the FBI requirements. This notice of intent is not a request for competitive quotations; however, interested parties may identify their interests and capability to respond to this requirement to this office by 9:00 am, EST, September 30, 2015, by email to the attention of Lynda M. Theisen, Contracting Officer at Lynda.Theisen@ic.fbi.gov. Information received will be considered solely for the purpose of determining whether or not to conduct a competitive procurement. Telephone requests will not be considered. A determination by the Government not to compete this proposed contract based upon response to this notice is solely within the discretion of the Government. Vendors must be registered in SAM, effective July 29, 2012 to receive government contracts. The FBI uses a financial system that has a direct interface with SAM. Please ensure that your company's SAM information is updated and accurate. This includes TIN, EFT, DUNS, addresses and contact information. The EFT banking information on file in SAM will be what the FBI uses to process payment to contractors.