CW OPO laser source

The Department of Commerce, through the Office of the Director, is seeking a CW OPO laser source to support the development of advanced measurement technology, reference data, and materials. This initiative aims to achieve sub-parts-per-billion precision in trace impurity gas analysis, which is essential for enhancing next-generation diagnostics and critical tooling such as extreme ultra-violet lithography. By establishing a framework for impurity fingerprinting with traceability to new primary standards, the project will enable partners to create industry-ready reference materials and point-of-use diagnostics. This forecast is categorized under NAICS code 334413 and will be performed in Gaithersburg, Maryland. The project focuses on improving quality systems through metrology-grade data and the creation of documentary standards to ensure high-level precision in process gas identification. Interested parties can coordinate through the designated point of contact, Nathali Medina.