This Solicitation opportunity from Government of Canada was posted on March 20, 2026. The submission period has ended. Browse the details below for market research, or find similar active opportunities.

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Dynamic Secondary Ion Mass Spectroscopy Characterization System

Closed

25-58294International

Submission Closed03/20/2026, 02:00:00 PM UTC

Contract Overview

Solicitation details, issuing organization, response deadlines, documents, and interested companies for this government contract opportunity.

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NAICS: 333242

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AI Contract Overview

The contract seeks a supplier to provide a Dynamic Secondary Ion Mass Spectrometry (SIMS) system designed for advanced semiconductor material characterization. The system must deliver high performance in sensitivity, depth resolution, and sample throughput, capable of analyzing a broad range of semiconductor materials such as Group IV, III/V, III/Nitride, and II-VI compounds, along with numerous elements. The scope encompasses not only the manufacture, delivery, installation, and commissioning of the equipment but also includes comprehensive post-installation support. This support involves operator training and a long-term maintenance agreement to ensure continuous high instrument uptime. The solicitation is issued by the National Research Council of Canada under solicitation number 25-58294, with the response deadline set for March 20, 2026, and all deliverables required by March 31, 2027. The project will take place in Canada, and inquiries can be directed to the designated contracting authority, Veronica Exari. This contract reflects a significant investment in cutting-edge analytical capabilities to support semiconductor research and development within a federal government framework.

General Info

Supply and install high-performance SIMS system for semiconductor analysis with training and maintenance.

Agency

Government of Canada → National Research Council of CanadaView Agency

NAICS

333242 - Semiconductor Machinery ManufacturingView NAICS

Place of Performance

*Canada, CAN

Set-Aside

NONE

Documents

(6)

RFP 25-58294 Système de caractérisation par spectrométrie de masse d’ions secondaires dynamique

PDF•89 pages•rfp

25-58294 NPP SIMS Dynamic Secondary Ion Mass Spectrometry System RFP

PDF•3 pages•rfp

RFP 25-58294 Dynamic Secondary Ion Mass Spectroscopy Characterization System

PDF•3 pages•rfp

Amendment 01 to RFP 25-58294 Dynamic Secondary Ion Mass Spectroscopy System

PDF•15 pages•amendment

Amendment 02 to RFP 25-58294 Dynamic Secondary Ion Mass Spectroscopy Characterization System

PDF•2 pages•amendment

RFP 25-58294 Dynamic Secondary Ion Mass Spectroscopy Characterization System

PDF•79 pages•rfp

AI Contract Breakdown

Uniform Contract Format

Timeline

PhaseClosed

PostedMar 20

Solicitation

Response DeadlineMar 20

Deadline has passed

Submission Closed

03/20/2026, 02:00:00 PM UTC

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Organization & Contact Information

AgencyGovernment of Canada → National Research Council of Canada

Contacts1 person available

OfficeN/A

Organization / Agency

Government of Canada → National Research Council of Canada

View Agency Profile

Office AddressN/A

Contacts

Veronica ExariPoint of Contact

contact@example.gov

+1 (555) 000-0000

Full Description

The objective of this solicitation is to select a supplier to manufacture, deliver, install, and commission a state-of-the-art Dynamic Secondary Ion Mass Spectrometry (SIMS) system. The proposed system must meet rigorous performance standards regarding sensitivity, depth resolution, and sample throughput. It must be capable of characterizing a comprehensive suite of semiconductor materials, including Group IV, III/V, III/Nitride, and II-VI compounds, and a wide range of elements. Additionally, the scope includes comprehensive post-installation support, including operator training and a long-term maintenance agreement to ensure high instrument uptime. All the deliverables must be received on or before March 31, 2027.