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This Solicitation opportunity from Government of Canada was posted on February 12, 2026. The submission period has ended. Browse the details below for market research, or find similar active opportunities.

Dynamic Secondary Ion Mass Spectroscopy Characterization System

Closed
25-58294Canada

Contract Overview

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The contract seeks a supplier to provide a Dynamic Secondary Ion Mass Spectrometry (SIMS) system designed for advanced semiconductor material characterization. The system must deliver high performance in sensitivity, depth resolution, and sample throughput, capable of analyzing a broad range of semiconductor materials such as Group IV, III/V, III/Nitride, and II-VI compounds, along with numerous elements. The scope encompasses not only the manufacture, delivery, installation, and commissioning of the equipment but also includes comprehensive post-installation support. This support involves operator training and a long-term maintenance agreement to ensure continuous high instrument uptime. The solicitation is issued by the National Research Council of Canada under solicitation number 25-58294, with the response deadline set for March 20, 2026, and all deliverables required by March 31, 2027. The project will take place in Canada, and inquiries can be directed to the designated contracting authority, Veronica Exari. This contract reflects a significant investment in cutting-edge analytical capabilities to support semiconductor research and development within a federal government framework.

General Info

Supply and install high-performance SIMS system for semiconductor analysis with training and maintenance.

Agency

Government of Canada → National Research Council of Canada

NAICS

333242 - Semiconductor Machinery Manufacturing View NAICS

Place of Performance

Canada, CAN

Set-Aside

NONE

Documents

(6)

RFP 25-58294 Système de caractérisation par spectrométrie de masse d’ions secondaires dynamique

PDF89 pagesrfp

25-58294 NPP SIMS Dynamic Secondary Ion Mass Spectrometry System RFP

PDF3 pagesrfp

RFP 25-58294 Dynamic Secondary Ion Mass Spectroscopy Characterization System

PDF3 pagesrfp

Amendment 01 to RFP 25-58294 Dynamic Secondary Ion Mass Spectroscopy System

PDF15 pagesamendment

Amendment 02 to RFP 25-58294 Dynamic Secondary Ion Mass Spectroscopy Characterization System

PDF2 pagesamendment

RFP 25-58294 Dynamic Secondary Ion Mass Spectroscopy Characterization System

PDF79 pagesrfp

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Timeline

PhaseClosed
Posted

Solicitation

Response Deadline

Deadline has passed

Submission Closed

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Organization & Contact Information

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AgencyGovernment of Canada → National Research Council of Canada
Contacts1 person available
OfficeN/A
Organization / Agency
Government of Canada → National Research Council of Canada
Office AddressN/A
Contacts
Veronica ExariContracting Authority

Full Description

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The objective of this solicitation is to select a supplier to manufacture, deliver, install, and commission a state-of-the-art Dynamic Secondary Ion Mass Spectrometry (SIMS) system. The proposed system must meet rigorous performance standards regarding sensitivity, depth resolution, and sample throughput. It must be capable of characterizing a comprehensive suite of semiconductor materials, including Group IV, III/V, III/Nitride, and II-VI compounds, and a wide range of elements. Additionally, the scope includes comprehensive post-installation support, including operator training and a long-term maintenance agreement to ensure high instrument uptime. All the deliverables must be received on or before March 31, 2027.