High-Resolution FE-SEM System Supply

The contract involves the supply of a complete high-resolution Field-Emission Scanning Electron Microscope system tailored for advanced materials research at the National Institute of Standards and Technology in Gaithersburg, Maryland. The system must include integrated Energy Dispersive X-ray Spectroscopy and Electron Backscatter Diffraction detectors, along with sophisticated software capable of high-precision imaging and analytical operations. This procurement is intended to enhance NIST’s capabilities in microstructural characterization and materials analysis, ensuring the highest standards of accuracy and reproducibility in scientific measurement. The opportunity is classified as a subcontract with a NAICS code of 334516 related to scientific and technical instruments manufacturing. The solicitation was posted on July 17, 2026, with a response deadline set for July 31, 2026. Performance of the contract will take place at NIST’s Gaithersburg facility, with the delivered system expected to meet rigorous federal standards for instrumentation and technical performance. All suppliers must be prepared to support integration, calibration, training, and ongoing technical assistance to ensure full operational capability within NIST’s research environment.