Low-Temperature (LT) Scanning Probe Microscope (SPM)

BSA is seeking to procure the integration of a low-temperature scanning probe microscope (LT-SPM) into an existing multiprobe ultra-high vacuum (UHV) surface analysis system. The project involves designing and developing the LT-SPM without compromising the original system's functionality. Key components include a new SPM scanner, a sample stage featuring seven additional electrical contacts, a removable magnetic field assembly, internal electronics, and corresponding wiring and cabling. The system will utilize an existing cryostat previously acquired for a similar LT-STM system, and all new cabling must be compatible with the Scienta Omicron MATRIX SPM controller currently in use. The supplier is also responsible for designing and constructing a new UHV SPM chamber that integrates seamlessly with the existing multiprobe setup, facilitating smooth transfer of samples and STM tips, and ensuring reliable operation under UHV conditions. Installation of all components inside the cryostat, including internal electronics, wiring, and cabling, will be carried out at Brookhaven National Laboratory (BNL). The final system must undergo performance and quality validation through atomic resolution testing on Au(111) crystal or graphite surfaces using both STM and AFM techniques. The contract is managed by the Department of Energy's Brookhaven National Laboratory, with responses due by June 23, 2026.