This Combined Synopsis/Solicitation opportunity from Department Of Energy was posted on May 22, 2026. The submission period has ended. Browse the details below for market research, or find similar active opportunities.
Low-Temperature (LT) Scanning Probe Microscope (SPM)
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Brookhaven Science Associates, LLC is procuring the integration of a low-temperature scanning probe microscope (LT-SPM) into an existing multiprobe ultrahigh vacuum (UHV) surface analysis system at Brookhaven National Laboratory. The contractor must design and build a new UHV SPM chamber in close collaboration with CFN staff, ensuring seamless sample and tip transfer between chambers while maintaining full compatibility with the existing system. The LT-SPM will feature a new scanner, a sample stage with seven additional electrical contacts, a removable magnetic field assembly, internal electronics, and all necessary wiring and cabling, all of which must interface with the existing Scienta Omicron MATRIX SPM controller and the previously purchased cryostat. The system must achieve atomic resolution for both scanning tunneling microscopy (STM) and atomic force microscopy (AFM) on Au(111) or graphite surfaces, verified through performance testing. The contract requires the supplier to deliver a fully integrated and tested system within 18 weeks after receipt of order, with the SPM chamber design completed within three weeks of order placement. The radiation shield box will be shipped by CFN to the supplier within one week of order to enable manufacturing modifications. The procurement is a firm fixed price contract under NAICS code 334516, issued as full and open competition with no set aside. All pricing must be in U.S. dollars, inclusive of taxes and duties, and remain firm for 90 days. Payment terms are Net 30 days for large or foreign businesses and Net 10 days for small businesses. Suppliers must be registered in SAM.gov with a valid Unique Entity ID, and foreign vendors must complete AMS Form 050 if not registered. Required documentation includes the W-9 or W-8 form, ACH authorization, and proof of ISO 9001 quality system certification. All components must comply with ASTM D3951 packaging standards, with special attention to ESD protection, serial and lot numbering, and prohibition of asbestos-contaminated vermiculite. The contractor must adhere to Buy American Act requirements, provide detailed special process procedures for welding, bonding, plating, and other critical operations, and ensure material shelf life retains at least three-quarters of its original duration upon delivery. Technical submissions must include descriptive materials, drawings, and references demonstrating prior successful fabrication and delivery of at least three comparable LT-STM/QPlus AFM systems. All proposals must be submitted via email by June 23
General Info
Agency
NAICS
Place of Performance
Upton, NY, 11973, USASet-Aside
Timeline
Submission Closed
Organization & Contact Information
Full Description
BSA is procuring the Integration of a Low-Temperature SPM into a Multiprobe UHV Surface Analysis System. The requirement form and/or function supports the design and development of a lowtemperature scanning probe microscope (LT-SPM) and its integration into the existing multiprobe system without compromising or sacrificing any original system functionality. The LT-SPM will include a new SPM scanner, a sample stage with seven additional electrical contacts, a removable magnetic field assembly, required internal electronics, and all necessary wiring and cabling, while utilizing an existing cryostat previously purchased from the same Supplier for a prior LT-STM system. All SPM cabling will be compatible with the existing Scienta Omicron MATRIX SPM controller. In addition, A UHV SPM chamber will be designed and built by the Supplier in close collaboration with CFN staff to ensure full compatibility with the existing multiprobe system, enabling smooth sample and STM tip transfer between chambers and reliable SPM operation under UHV conditions. The Supplier will install all new components within the cryostat at CFN, including internal electronics, wiring, and cabling, and will perform system performance and quality tests on an Au(111) crystal or graphite surface to demonstrate atomic resolution for both STM and AFM.
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