Multi-Purpose X-Ray Diffraction (XRD) System - Sole Source

Oregon State University intends to contract for the provision of a Multi-Purpose X-Ray Diffraction (XRD) System from Malvern Panalytical as a sole source because of the uniqueness (design, capability, nature) of the goods and/or services, and the contractor being the single provider of the goods and/or services. Required minimum specifications must include, at a minimum, a system that can support the following applications: (1) analysis of (epitaxial) thin films, including grazing incidence XRD (GIXRD), X-Ray reflectomertry (XRR), rocking curves, and residual stress analysis; (2) in-situ characterization of advanced manufactured (AM) materials and include monocapillary optics and a large area detector for 2D measurements for residual stress analysis, microdiffraction, 2D diffraction with an area detecter, and texture (pole figure) analysis; (3) in-situ characterization of electrochemical cells with a hard radiation source and an electrochemical stage with temperature control; (4) in-situ environmental XRD measurements in a chamber that provides relative humidity and temperature control (both heating and cooling). In addition to supporting the above-listed applications, it is necessary that experiments under applications 1 and 2 can be supported by automation such that the system may be configured for the experiments without physically changing optics or accessories. It is also necessary that automated reconfiguration be available for GIXRD, XRR, rocking curves, residual stress analysis, microdiffraction, 2D diffraction, and texture (pole figure) experiments. An entity may challenge this determination no later than the closing date indicated on the website. Challenges must be submitted to Scott Lommers by email at Scott.Lommers@oregonstate.edu.