Single Particle Spectroscopoy Microscope

The Department of Commerce Office of the Director is seeking to develop advanced measurement technology, reference data, and materials to enable trace impurity gas analysis with precision levels below one part-per-billion. This initiative aims to support the creation of industry-ready reference materials and point-of-use diagnostics, which are essential for breakthroughs in critical tooling such as extreme ultra-violet lithography. By establishing a framework for impurity fingerprinting with traceability to new primary standards, the project will significantly enhance quality systems and diagnostic capabilities. This forecast, titled Single Particle Spectroscopy Microscope, is associated with NAICS code 334413 and will be performed in Gaithersburg, Maryland. The project focuses on delivering metrology-grade data to drive the development of next-generation diagnostics and documentary standards for process gases. Interested parties may coordinate through the designated point of contact, Nathali Medina.