Nanoscale spectroscopic IR-AFM-NSOM sy stem

Requirements Document: Nanoscale IR spectroscopic-AFM-s-SNOM capability Background: A novel capability for nanoscale broadband infrared (IR) spectroscopy (NBIS) with Atomic Force Microscopy (AFM) and apertureless Scanning Near-field Optical Microscopy (s-SNOM) is needed to better understand and control smart materials that impact signature management, multi-functionality, and thermal management. These areas are critical for future Soldier needs and under increasing emphasis at CCDC-Soldier Center. In addition, there are no or poorly written requirements for these areas, which may result in wasted acquisition dollars spent because S&T and PM personnel don't understand well enough proposed new capabilities in the infrared regime and especially in the new areas of smart materials and e-textiles. This capability would give critical understanding and control of nano-infrared capabilities to the acquisition and technical workforce. Traditional Fourier Transform InfraRed (FTIR) Spectroscopy FTIR involves the use of a broadband light source to illuminate a sample, with use of an interferometer to very accurately measure the different frequency (Fourier) components of the broadband infrared signal. Recently, based on exciting research results from academia, companies have begun to develop technology for measuring the infrared response of very small nanoscale regions on surfaces, which is important for understanding how material properties influence infrared functionality and properties. - AFM-IR is a new technique where a sample is illuminated by a tunable broadband infrared laser, which excites the sample's absorption resonances that occur at wavelengths within the laser excitation wavelength range. These infrared excitations heat the sample more efficiently than other wavelengths, and this manifests itself as an increased AFM signal at these resonant wavelengths, identifying them by their heightened response. Hence, this - AFM-IR is a new nanoscale IR spectroscopic technique. - s-SNOM is also a nanoscale IR spectroscopic technique, where apertureless SNOM measures the scattered and/or absorbed and/or reflected near-field light created by infrared excitation as a function of IR wavelength, to better understand important infrared functionalities and properties. Requirements: The Nanoscale IR spectroscopic-AFM-s-SNOM capability system must have: 1) Broadband infrared laser source to illuminate the sample, with wavelength range from 2.5 mm to 15 mm wavelength (670 to 4000cm-1), especially the important 800 cm-1 to 1850 cm-1 (5.4 to 12.5 mm) sub-range. By extending the source's range past 14 mm and below 5 mm, it will be possible to excite certain polymer and nanostructure absorption and scattering resonances that are of interest. The broadband infrared laser source must have both pulsed and continuous wave (cw) modes and enough power to heat the sample locally and enable both AFM measurement of thermal absorption resonances (in pulsed mode) and s-SNOM optical measurement of absorption and/or reflection and/or scattering resonances. Both these measurement techniques must be possible to carry out from the same overall system. E.g., it is impractical to make these measurements using two separate sources and setups. Tunability of the broadband source is desired in the wavelength region for the AFM spectroscopy (AFM-IR). Note that modulation of visible light via a - photothermal effect is not a desired technique. 2) Associated basic and advanced training to enhance understanding of smart materials and their analysis by acquisition personnel. Advanced training will be conducted after users have basic training and have time to use the system's capability. There should be at least 2 or 3 days of initial installation and training, followed by a total of at least four days training to be scheduled later, upon return of the contractor to the government site at a mutually agreeable date. These four days should be split up into at least 2 different non-continuous sessions, in order to enable acquisition personnel to learn more about using this advanced capability on their own time, before the contractors return to provide more specialized training. 3) AFM capability for nanoscale imaging and spectroscopy (AFM-IR), including tapping mode, to measure thermal absorption resonances. The tapping or contact AFM response changes due to mechanical deformation from thermal expansion (or contraction) from resonant infrared (heat) absorption from the broadband infrared laser. The change in the AFM response should be measured using an a.c. technique, a pulsed broadband laser with tuned output in a wide, 670 to 2000 cm-1 (5 to 15 mm wavelength) range, and with the AFM in tapping mode. In the future, it is desirable to increase tunability to 4000 cm-1 (2.5 mm wavelength), in order to characterize important chemical resonances around 3 mm wavelength. 4) Apertureless s-SNOM optical capability for measurement of absorption and/or reflectivity and/or scattering resonances near the scanning AFM head, illuminating with a broadband IR laser source, in continuous wave (cw) mode, in the range of at least 670 cm-1 to 2000 cm-1 (5 to 15 mm). s-SNOM spectroscopic measurements to 4000 cm-1 (2.5 mm) are desirable. 5) Appropriate electronic control including possible computer(s) with software for controlling the system. Shipping Address: 10 General Greene Avenue Warehouse 20 Attn: Richard Osgood Natick, MA 01760