Supply of OEM Consumable Parts for FIB-SEM System

The contract involves the supply of original equipment manufacturer (OEM) consumable parts essential for the maintenance of Focused Ion Beam-Scanning Electron Microscopy (FIB-SEM) systems. Key components required under this agreement include gallium ion sources, electron cathodes, apertures, and filters, all critical for the optimal functioning and upkeep of the equipment. The procurement ensures that these parts are sourced directly from OEMs, ensuring compatibility, quality, and reliability for system maintenance. Issued by the Department of Health and Human Services under the National Institutes of Health Olao, this subcontract aims to secure these consumable components within a clearly defined timeline. The solicitation was posted on June 4, 2026, with a response deadline set for June 11, 2026. The contract falls under NAICS code 333318, indicating it pertains to manufacturing industrial machinery and equipment. Although specific location details for performance or contact information were not provided, the emphasis is on timely procurement to support ongoing FIB-SEM maintenance activities.