Surface Profiler & Atomic Force Microscope

Texas A&M University is soliciting bids under solicitation number 28-EQUI-ITB-1612 for the procurement of a Surface Profiler and Atomic Force Microscope (AFM) system. The equipment must meet strict technical specifications, including a vertical noise floor of less than 30 pm RMS for the AFM and a step height repeatability of 0.4 nm for the profiler. The scope of work includes the delivery of the hardware, software, and accessories, as well as four days of on-site installation and training conducted by a qualified manufacturer representative. Deliverables also include a 12-month parts-and-labor warranty and enrollment in a Complete Care Support Program for priority technical support and maintenance. Bids must be submitted electronically via the AggieBid portal by July 17, 2025, at 2:00 PM CDT. While specific brands and models are mentioned for illustrative purposes, equivalent items will be considered provided the vendor submits the manufacturer, model number, and detailed specification sheets for agency determination. Award decisions will be based on a best-value trade-off, considering low price alongside factors such as material quality, bidder experience, financial stability, and delivery timelines. The contract requires compliance with Executive Order GA-48 regarding restricted entities, export control regulations, and the provision of a Certificate of Insurance before work begins. Shipping terms are FOB Destination to College Station, Texas, and payment terms are Net 30. Vendors are responsible for the removal and disposal of all packing materials following installation.