300 mm wafer probe station
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The Department of Commerce, specifically the AD for Laboratory Programs, is forecasting the procurement of a semi-automatic 300 mm wafer probe station. This specialized equipment is designed for DC probing using a four-probe configuration and must include a hot chuck, a thermal chuck controller, a microscope, and a vibration isolation table to ensure precision and stability during operation. The project is categorized under NAICS code 333242 and is slated for performance in Gaithersburg, Maryland. Interested parties can coordinate through the point of contact, Leeanna J. Hopkins, regarding this upcoming requirement.
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Place of Performance
GAITHERSBURG, MDSet-Aside
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