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This Government Contract opportunity from Department Of Defense was posted on May 28, 2026. The submission period has ended. Browse the details below for market research, or find similar active opportunities.

Custom Electro-Optical Component Design and Fabrication

Closed
Federal

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The contract involves the design, engineering, and production of a specialized 2.6 numerical aperture Gallium Arsenide Semiconductor Integrated Lens (SIL), which includes a custom backing objective and incorporates a 100-meter radial shear testing capability. This project requires advanced electro-optical component expertise and precise fabrication techniques to meet stringent performance standards. The work is classified under NAICS code 334510 and is issued as a subcontract by the Department of Defense through the Naval Surface Warfare Center (NSWC) Crane. Performance of the contract is set to take place in Crane, Indiana, with a firm deadline for responses by June 4, 2026. The focus is on delivering a custom-built optical element that integrates both the lens and objective, supporting high-fidelity testing essential for defense applications. The contract emphasizes cutting-edge semiconductor materials, precise engineering, and rigorous testing to ensure functionality in demanding operational environments.

General Info

Design and production of custom 2.6 NA Gallium Arsenide SIL with 100m shear testing for defense.

Agency

Department Of Defense → Nswc Crane

NAICS

334510 - Electromedical and Electrotherapeutic Apparatus Manufacturing View NAICS

Place of Performance

Crane, IN, 47522, USA

Set-Aside

NONE

Documents

(0)

No documents available

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Timeline

PhaseClosed
Posted

subcontract

Response Deadline

Deadline has passed

Submission Closed

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Organization & Contact Information

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AgencyDepartment Of Defense → Nswc Crane
ContactsNo contacts available
OfficeN/A
Organization / Agency
Department Of Defense → Nswc Crane
Office AddressN/A
ContactsNo contact information available

Full Description

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Design, engineering, and production of a 2.6NA GaAs Semiconductor Integrated Lens (SIL) with custom backing objective and 100m radial shear testing capability.