ION MASS SPECTROMETRY (SIMS) ANALYSIS ON SEMICONDUCTOR BULK CRYSTALS AND FILM SAMPLES
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This contract outlines a sole source procurement for ion mass spectrometry (SIMS) trace analysis characterization services to be performed by Evans Analytical Group on semiconductor bulk crystals and film samples provided by the Air Force Research Laboratory (AFRL/SNHC). The work involves conducting 10 measurements each using oxygen and cesium ion bombardment species on two specimen types: bulk crystal specimens measuring at least 5mm x 5mm and layered surface specimens of similar size. Annually, between 30 and 35 specimens will be analyzed, split between 20 bulk and 10 layer analysis samples. Each specimen requires a detailed report covering detection limits, elemental quantification, instrumental conditions, and graphical presentation of elemental concentration versus depth. Reports are expected within two weeks after specimen receipt, with AFRL/SNHC responsible for mailing specimens as needed. The analyses must meet current standards for a range of semiconductor materials including AlN, GaAs, GaN, GaSb, and ZnO, with specified elements targeted for detection and quantification in each material system. The contract is issued under FAR 13.501 using simplified acquisition procedures and is justified as a sole source due to compatibility requirements with existing data files. Although this notice serves as an intent to award with an anticipated award date around June 13, 2007, the government will consider any proposals received by June 12, 2007, solely to determine if a competitive procurement is warranted. All communications and inquiries are directed to Filomena Gomez.
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