MFM probe to enable sub diffraction and co-location of optical and magnetic surface measurements
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The Department of Commerce, specifically the AD for Laboratory Programs, has issued a forecast for a project focused on the development of a magnetic force microscopy probe. This technology is designed to enable sub-diffraction limited spatial resolution by co-locating optical and magnetic surface measurements, which allows for the precise identification of domain boundaries and defects when scanning surface magnetic properties. The project is categorized under NAICS code 334516 and is slated for performance in Gaithersburg, Maryland. Interested parties can coordinate with the point of contact, Min Jeong Ra, regarding this procurement forecast which was posted on May 12, 2026.
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GAITHERSBURG, MDSet-Aside
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