This Solicitation opportunity from Department Of Defense was posted on September 18, 2026. The submission period has ended. Browse the details below for market research, or find similar active opportunities.
Resistivity Measurement System Suite, 4-Point Probe
Contract Overview
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Solicitation SP4706-26-Q-0026, issued by the Department of Defense through the DLA Product Test Center, seeks a comprehensive multi-environment resistivity measurement system suite for the analysis of semiconductor materials, thin films, and conductive polymers. The required ecosystem consists of automated resistivity test stations featuring autorange and dual configuration capabilities, interchangeable SP4/HT4 series probe heads with configurable spring pressures and tip radii, a precision thermal chuck supporting temperatures from ambient to 300 degrees Celsius, a vibration isolation table, and NIST-traceable calibration standards. The system must include Windows-based OEM software for calculating sheet resistance and volume/bulk resistivity with CSV data export capabilities. The contractor is required to deliver all hardware, software, and accessories within 90 days of award on an FOB Destination basis to Philadelphia, Pennsylvania. Installation must be performed on-site by an OEM-certified Service Engineer adhering to ISO 9001 quality procedures, followed by site acceptance testing and IQ/OQ performance verification. The award includes a minimum one-year comprehensive warranty and a requirement for the contractor to provide a post-warranty support plan. Additionally, the contractor must provide one day of operator training for up to six individuals and ensure the system includes critical safety features such as hardware-based over-temperature interlocks and thermal shielding. Invoicing shall be processed through the Wide Area Workflow system under DoDAAC SL0701.
General Info
Place of Performance
Philadelphia, PA, USASet-Aside
Timeline
Submission Closed
Organization & Contact Information
Full Description
The objective of this acquisition is to provide the Department with a comprehensive, multi-environment resistivity measurement capability. This suite will support mission-critical analysis of semiconductor materials, thin films, and conductive polymers across a full range of physical and thermal conditions.
This Amendment to the Solicitation (SF30.pdf) is to reopen the solicitation to 9/18/2026 at 1500 EST due to a need for an update to the Performance Work Statement.
Please see attached Updated Performance Work Statement (PWS) (Updated PWS Tech Spec.pdf) for more specific technical information.
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