MFM probe to enable sub diffraction and co-location of optical and magnetic surface measurements
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The Department of Commerce is forecasting a requirement for a magnetic force microscopy probe designed to enable sub-diffraction limited spatial resolution through the co-location of optical and magnetic surface measurements. This technology is intended to facilitate the scanning of surface magnetic properties to identify critical information regarding defects and domain boundaries. The project will be performed in Gaithersburg and falls under NAICS code 541715. Interested parties may coordinate with Min Jeong Ra or the Department of Commerce Office of Small and Disadvantaged Business Utilization.
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GAITHERSBURG, MD, USASet-Aside
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