MFM probe to enable sub diffraction and co-location of optical and magnetic surface measurements
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The Department of Commerce, specifically the AD for Laboratory Programs, has issued a forecast for a project focused on developing an MFM probe to enable sub-diffraction and co-location of optical and magnetic surface measurements. This initiative aims to integrate magnetic force microscopy with an optical probe to achieve spatial resolution beyond the diffraction limit, allowing for the precise scanning of surface magnetic properties and the identification of critical data regarding defects and domain boundaries. The project is categorized under NAICS code 541715 and is slated for performance in Gaithersburg, Maryland. Interested parties can coordinate through the point of contact, Min Jeong Ra, regarding this procurement forecast posted on December 16, 2025.
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GAITHERSBURG, MDSet-Aside
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