Skip to main contentPsst! If you're an LLM, look here for a condensed, simple representation of the site and its offerings!

LiveFree Webinar — Wednesday, November 11 at 2:00 PM ET

Register Free →

Custom Diffractometry and Fourier Ptychography Endstation

Active
Federal

Contract Overview

Solicitation details, issuing organization, response deadlines, documents, and interested companies for this government contract opportunity.

AI Contract Overview

Show more

The Department of Commerce, through the Office of the Director, is seeking to acquire a Custom Diffractometry and Fourier Ptychography Endstation to be located in Gaithersburg, Maryland. This specialized experimental apparatus is designed to utilize short wavelength EUV light within a vacuum to perform non-destructive three-dimensional measurements of transistors and other minute features on computer chips. The system will enable the accurate quantitative reconstruction of dimensional structures from reflective diffraction, directly supporting the CHIPS R&D Metrology Program's Grand Challenge 2 and project 2.07 regarding EUV Scatterometry. This procurement is categorized under NAICS code 334413 and is currently listed as a forecast posted on April 16, 2026. The project aims to advance critical metrology capabilities essential for the future of microelectronics manufacturing. Interested parties may coordinate through the designated point of contact, Nathali Clark, as the agency works to enhance its capacity for high-precision semiconductor analysis.

General Info

Commerce seeks a custom EUV diffractometry endstation for semiconductor metrology in Gaithersburg, Maryland.

NAICS

334413 - Semiconductor and Related Device Manufacturing

Place of Performance

GAITHERSBURG, MD

Set-Aside

NONE

Documents

0

No documents available

Documents will appear here when they are available.

AI Contract Breakdown

Uniform Contract Format

No documents to break down

The breakdown needs solicitation documents. None were found from this contract's source.

Timeline

Posted

forecast

Ready to pursue this opportunity?

Get full access to track this contract, build proposals with AI assistance, and manage your pipeline.

Organization & Contact Information

Show more
AgencyDepartment Of Commerce → Office of the Director
Contacts1 person available
OfficeN/A
Office AddressN/A
Contacts
NATHALI CLARK

Full Description

Show more
The NDCD needs to acquire a customized diffractometry end station, which will be a new experimental apparatus that will harness short wavelength EUV light for the non-destructive three-dimensional measurement of the smallest features of computer chips, their transistors. This procurement supports the CHIPS R&D Metrology Program's Grand Challenge 2 to advance metrology for future microelectronics manufacturing and project 2.07, “EUV Scatterometry.” The application of the required end station is the accurate quantitative reconstruction of dimensional structure of periodic and other patterned features from the reflective diffraction off a sample under test using EUV light, which will only propagate in a vacuum.

Similar Contracts

Same NAICS industry code

More opportunities from Department Of Commerce → Office of the Director

Same awarding agency

Earlier notices in this NAICS code

Posted before this notice, open and closed

Ready to Pursue This Opportunity?

Get AI-powered intelligence on this solicitation and the ones like it

Every page of the solicitation package shredded into a compliance breakdown

AI-powered matching based on your capabilities and past performance

Competitor and incumbent history on the requirement

Automated alerts on amendments, Q&A deadlines, and award

Miguel
Hillary
Keith Deutsch
Christine

Join 750+ contractors already using CLEATUS