Deferentially pumped focused x-ray source
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The Department of Commerce is seeking a differentially pumped focused x-ray source to support the development of a new plasma-XPS metrology platform. This initiative leverages expertise in plasma-surface interaction and operando photoelectron spectromicroscopy to enable quantitative, sub-monolayer sensitive chemical analysis of wafer surfaces, thin films, and interfaces in real time during plasma processing. The project aims to enhance semiconductor process development and inspection toolsets for next-node manufacturing while advancing the fundamental measurement science of plasma-surface interactions. The project will be performed in Gaithersburg and involves strategic collaborations between industrial partners and academia for the implementation and dissemination of the technology. This effort is categorized under NAICS code 334413 and is currently listed as a forecast. Primary points of contact for the procurement include Nathali Medina and the DOC OSDBU.
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GAITHERSBURG, MD, USASet-Aside
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