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Optical Frequency Comb System (far-IR)

Active
Federal

Contract Overview

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The Department of Commerce is seeking to develop advanced measurement technology, reference data, and materials to enable trace impurity gas analysis with precision levels below one part-per-billion. This initiative focuses on creating next-generation diagnostics and metrology-grade data to establish a framework for impurity fingerprinting, which is essential for breakthroughs in critical tooling such as extreme ultra-violet lithography. The project aims to produce industry-ready reference materials and point-of-use diagnostics with traceability to new gas primary standards. This forecast, titled Optical Frequency Comb System (far-IR), is associated with NAICS code 334413 and will be performed in Gaithersburg. Interested parties can coordinate with the Department of Commerce, specifically through the designated point of contact, Nathali Medina, or the Small Business Specialist at the Office of Small and Disadvantaged Business Utilization.

General Info

Commerce seeks advanced measurement technology for trace impurity gas analysis in Gaithersburg.

Agency

Department of Commerce

NAICS

334413 - Semiconductor and Related Device Manufacturing

Place of Performance

GAITHERSBURG, MD, USA

Set-Aside

NONE

Documents

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Timeline

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Organization & Contact Information

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AgencyDepartment of Commerce
Contacts2 people available
OfficeN/A
Organization / Agency
Department of Commerce
Office AddressN/A
Contacts

Full Description

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We will create measurement technology, reference data and materials to perform trace impurity gas analysis at new levels of precision. Success will enable next-generation diagnostics to reliably identify impurities in process gases at sub-parts-per-billion (<1 ppb) levels. Results will drive partners to develop industry-ready reference materials, point-of-use diagnostics and models to achieve breakthroughs in critical tooling like extreme ultra-violet lithography. Our diagnostics and metrology-grade data will enhance quality systems by establishing a framework for impurity fingerprinting with traceability to new gas primary standards, reference materials and documentary standards.

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