Custom Diffractometry and Fourier Ptychography Endstation
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The Department of Commerce is seeking to acquire a customized diffractometry and Fourier ptychography end station to be located in Gaithersburg. This new experimental apparatus is designed to utilize short wavelength EUV light within a vacuum to perform non-destructive three-dimensional measurements of the smallest features and transistors on computer chips. The system will enable the accurate quantitative reconstruction of dimensional structures from reflective diffraction off samples under test. This procurement is a critical component of the CHIPS R&D Metrology Program, specifically supporting Grand Challenge 2 and project 2.07, EUV Scatterometry, to advance metrology for future microelectronics manufacturing. The project is categorized under NAICS code 334413 and was posted as a forecast on August 21, 2026.
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GAITHERSBURG, MD, USASet-Aside
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