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XPS System (X-Ray Photoelectron Spectroscopy System)

Active
Federal

Contract Overview

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The Department of Commerce is forecasting the acquisition of an advanced X-Ray Photoelectron Spectroscopy system to support the NIST CHIPS Metrology Program in Gaithersburg. This high-specification tool will feature HAXPES for deep surface and chemical composition analysis beyond 20 nanometers, small area imaging, and GCIB for gentle cleaning. The system is designed to probe material properties during packaging and study electronic structures through in-situ surface modification capabilities. Classified under NAICS code 334413, this procurement aims to significantly upgrade surface analysis capabilities for current and future research projects. Interested parties can coordinate with the point of contact, Nathali Medina, or the DOC Office of Small and Disadvantaged Business Utilization regarding this upcoming requirement.

General Info

Department of Commerce seeks an advanced X-Ray Photoelectron Spectroscopy system for NIST research.

Agency

Department of Commerce

NAICS

334413 - Semiconductor and Related Device Manufacturing

Place of Performance

GAITHERSBURG, MD, USA

Set-Aside

NONE

Documents

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Timeline

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forecast

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Organization & Contact Information

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AgencyDepartment of Commerce
Contacts2 people available
OfficeN/A
Organization / Agency
Department of Commerce
Office AddressN/A
Contacts

Full Description

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NIST is acquiring an advanced XPS system with HAXPES and small area imaging to boost its CHIPS Metrology Program. This tool will analyze surface and chemical composition (including interfaces up to 30 nm), probe material properties during packaging, and study electronic structure. Key features include HAXPES for deeper analysis (over 20 nm), GCIB for gentle cleaning, and in-situ capabilities for surface modification and electronic structure study. This upgrade will significantly enhance NIST's surface analysis capabilities for current and future projects.

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