XPS System (X-Ray Photoelectron Spectroscopy System)
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The Department of Commerce is forecasting the acquisition of an advanced X-Ray Photoelectron Spectroscopy system to support the NIST CHIPS Metrology Program in Gaithersburg. This high-specification tool will feature HAXPES for deep surface and chemical composition analysis beyond 20 nanometers, small area imaging, and GCIB for gentle cleaning. The system is designed to probe material properties during packaging and study electronic structures through in-situ surface modification capabilities. Classified under NAICS code 334413, this procurement aims to significantly upgrade surface analysis capabilities for current and future research projects. Interested parties can coordinate with the point of contact, Nathali Medina, or the DOC Office of Small and Disadvantaged Business Utilization regarding this upcoming requirement.
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GAITHERSBURG, MD, USASet-Aside
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