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Assembled circuit boards

Active
Federal

Contract Overview

Solicitation details, issuing organization, response deadlines, documents, and interested companies for this government contract opportunity.

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The Department of Commerce is forecasting a requirement for assembled circuit boards to support the development and reliability testing of wide bandgap power devices. These components are critical for all-electric applications in the automotive and aerospace sectors, where extreme reliability standards, such as failure rates of less than 1 ppm over 25 years, are mandatory. The project aims to address the current lack of direct correlation between rapid industry testing and long-term reliability, reducing the need for aggressive guard-banding and redundancy caused by incomplete data. This opportunity is listed under NAICS code 334413 and is slated for performance in Gaithersburg. Interested parties can coordinate with point of contact Nathali Clark or the DOC OSDBU for further information regarding this forecast.

General Info

Commerce seeks assembled circuit boards for wide bandgap power device reliability testing.

Agency

Department of Commerce

NAICS

334413 - Semiconductor and Related Device Manufacturing

Place of Performance

GAITHERSBURG, MD, USA

Set-Aside

NONE

Documents

0

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Timeline

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forecast

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Organization & Contact Information

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AgencyDepartment of Commerce
Contacts2 people available
OfficeN/A
Organization / Agency
Department of Commerce
Office AddressN/A
Contacts

Full Description

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Wide bandgap power devices are key to an all-electric future. Most of the applications in this all-electric future (automotive, aerospace, etc.) have extreme reliability requirements, such as less than 1 ppm failure in 25 years. Ensuring such extreme reliability requires careful modeling and use of aggressive guard-banding (de-rating parts) and redundancy to overcome risks due to incomplete or low-confidence reliability data. Fundamentally, there is a remarkable time cost associated with performing statistically significant long-term reliability tests with appropriate lifetime acceleration physics. This time cost is so steep that industry has turned to more expedient tests to test larger numbers of devices. The direct correlation between these rapid tests and long-term reliability is generally missing. As a result, designers of high reliability systems are left with an incomplete picture which further perpetuates the perceived need for

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