Custom Wafer Services
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The Department of Commerce is forecasting a requirement for Custom Wafer Services to address critical metrology challenges associated with mechanical strain in nanoscale semiconductor devices. Because strain significantly impacts device performance and manufacturing yields, the initiative focuses on advancing measurement techniques such as EBSD, TKD, 4-D STEM, Raman, and micro-XRD. The goal is to improve measurement accuracy and develop new reference materials to support the production of future-generation devices with increasing geometric complexity. This effort is managed under NAICS code 334413 and will be performed in Gaithersburg. Interested parties can coordinate with the point of contact, Nathali Medina, or the DOC Office of Small and Disadvantaged Business Utilization for further information regarding this forecast.
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GAITHERSBURG, MD, USASet-Aside
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