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Single Particle Spectroscopoy Microscope

Active
Federal

Contract Overview

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The Department of Commerce is forecasting a project titled Single Particle Spectroscopy Microscope to develop advanced measurement technology, reference data, and materials for trace impurity gas analysis. The primary objective is to achieve unprecedented precision, enabling next-generation diagnostics to identify impurities in process gases at sub-parts-per-billion levels. This initiative aims to support the development of industry-ready reference materials and point-of-use diagnostics, which are essential for breakthroughs in critical tooling such as extreme ultra-violet lithography. The project will establish a comprehensive framework for impurity fingerprinting with traceability to new gas primary standards and documentary standards to enhance overall quality systems. Performance for this effort is expected to take place in Gaithersburg, and the project falls under NAICS code 334413. Interested parties can coordinate through the Department of Commerce points of contact, including Nathali Medina and the DOC OSDBU.

General Info

Department of Commerce project developing high-precision spectroscopy for trace impurity gas analysis.

Agency

Department of Commerce

NAICS

334413 - Semiconductor and Related Device Manufacturing

Place of Performance

GAITHERSBURG, MD, USA

Set-Aside

NONE

Documents

0

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Timeline

Posted

forecast

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Organization & Contact Information

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AgencyDepartment of Commerce
Contacts2 people available
OfficeN/A
Organization / Agency
Department of Commerce
Office AddressN/A
Contacts

Full Description

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We will create measurement technology, reference data and materials to perform trace impurity gas analysis at new levels of precision. Success will enable next-generation diagnostics to reliably identify impurities in process gases at sub-parts-per-billion (<1 ppb) levels. Results will drive partners to develop industry-ready reference materials, point-of-use diagnostics and models to achieve breakthroughs in critical tooling like extreme ultra-violet lithography. Our diagnostics and metrology-grade data will enhance quality systems by establishing a framework for impurity fingerprinting with traceability to new gas primary standards, reference materials and documentary standards.

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